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Pregled bibliografske jedinice broj: 53813

Microhardness characterization of Al-W thin films


Stubičar, Mirko; Tonejc, Antun; Radić, Nikola
Microhardness characterization of Al-W thin films // Final Programme and Book of Abstracts, ISBN: 953-98154-0-x / Milun, Milorad ; Zorc, Hrvoje (ur.).
Zagreb: Hrvatsko vakuumsko društvo, 2000. str. 94-94 (predavanje, međunarodna recenzija, sažetak, znanstveni)


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Naslov
Microhardness characterization of Al-W thin films

Autori
Stubičar, Mirko ; Tonejc, Antun ; Radić, Nikola

Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, znanstveni

Izvornik
Final Programme and Book of Abstracts, ISBN: 953-98154-0-x / Milun, Milorad ; Zorc, Hrvoje - Zagreb : Hrvatsko vakuumsko društvo, 2000, 94-94

Skup
8th Joint Vacuum Conference of Croatia, Austria, Slovenia and Hungary and 7th Meeting of Croatia and Slovenia Vacuum Scientists

Mjesto i datum
Pula (Hrvatska), 4.-9. 06. 2000

Vrsta sudjelovanja
Predavanje

Vrsta recenzije
Međunarodna recenzija

Ključne riječi
Al-W tanki filmovi; Magnetronska kodepozicija; Rentgenska difrakcija; Vickersova mikrotvrdoća; Toplinska obrada.
(Al-W thin films; Magnetron cosputtering; X-ray diffraction; Vickers microhardness meassurements; Heat treatment.)

Sažetak
Binary alloys of aluminum and tungsten are interesting because of various possible engineering applications, e.g. as a corrosion resistant coating or as a difussion barrier layer at higher temperatures, etc. Thin films of Al-W alloys (Al82W18 to Al50W50), were prepared on the sapphire or alumina substrates by magnetron cosputtering technique. It is revealed by X-ray diffraction that films inside a composition range Al82W18 to Al62W38 are amorphous, while further addition of tungsten resulted in a small fraction of crystalline W phase within a dominant amorphous phase. Vickers microhardness measurements at room temperature were performed on the as-prepared and annealed Al-W thin films to characterize their mechanical behaviour and to correlate it with microstructural changes. Microhardness values on the films varied from about 8-10 GPa for completely amorphous films, up to 20 GPa for two-phase films. Main reason for this increase is probably a presence of a minor fraction of crystalline tungsten phase, beside dominant amorphous one. Experiments dealing with the effects of annealing conditions during heat-treatment upon microhardness and structural changes are in progress.

Izvorni jezik
Hrvatski

Znanstvena područja
Fizika, Kemija



POVEZANOST RADA


Projekt / tema
119495
119202
00980302

Ustanove
Institut "Ruđer Bošković", Zagreb,
Prirodoslovno-matematički fakultet, Zagreb

Profili:

Avatar Url Nikola Radić (autor)

Avatar Url Mirko Stubičar (autor)

Avatar Url Antun Tonejc (autor)

Citiraj ovu publikaciju

Stubičar, Mirko; Tonejc, Antun; Radić, Nikola
Microhardness characterization of Al-W thin films // Final Programme and Book of Abstracts, ISBN: 953-98154-0-x / Milun, Milorad ; Zorc, Hrvoje (ur.).
Zagreb: Hrvatsko vakuumsko društvo, 2000. str. 94-94 (predavanje, međunarodna recenzija, sažetak, znanstveni)
Stubičar, M., Tonejc, A. & Radić, N. (2000) Microhardness characterization of Al-W thin films. U: Milun, M. & Zorc, H. (ur.)Final Programme and Book of Abstracts, ISBN: 953-98154-0-x.
@article{article, year = {2000}, pages = {94-94}, keywords = {Al-W thin films, Magnetron cosputtering, X-ray diffraction, Vickers microhardness meassurements, Heat treatment.}, title = {Microhardness characterization of Al-W thin films}, keyword = {Al-W thin films, Magnetron cosputtering, X-ray diffraction, Vickers microhardness meassurements, Heat treatment.}, publisher = {Hrvatsko vakuumsko dru\v{s}tvo}, publisherplace = {Pula (Hrvatska)} }




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