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Pregled bibliografske jedinice broj: 516191

Nickel nanoparticles formed by magnetron sputtering


Jerčinović, Marko; Radić, Nikola; Buljan, Maja; Dubček, Pavo; Ristić, Mira; Sancho-Parramon, Jordi; Salamon, Krešimir; Bernstorff, Sigrid; Holý, Václav
Nickel nanoparticles formed by magnetron sputtering // 18th International Scientific Meeting on Vacuum Science and Technique: Programme and Book of Abstracts / Mozetič, Miran ; Vesel, Alenka (ur.).
Ljubljana: Slovenian Society for Vaccum Technique, 2011. str. 14-14 (pozvano predavanje, međunarodna recenzija, sažetak, znanstveni)


Naslov
Nickel nanoparticles formed by magnetron sputtering

Autori
Jerčinović, Marko ; Radić, Nikola ; Buljan, Maja ; Dubček, Pavo ; Ristić, Mira ; Sancho-Parramon, Jordi ; Salamon, Krešimir ; Bernstorff, Sigrid ; Holý, Václav

Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, znanstveni

Izvornik
18th International Scientific Meeting on Vacuum Science and Technique: Programme and Book of Abstracts / Mozetič, Miran ; Vesel, Alenka - Ljubljana : Slovenian Society for Vaccum Technique, 2011, 14-14

ISBN
978-961-92989-2-3

Skup
18th International Scientific Meeting on Vacuum Science and Techniques

Mjesto i datum
Bohinjsko Jezero, Slovenija, 02-03.06.2011

Vrsta sudjelovanja
Pozvano predavanje

Vrsta recenzije
Međunarodna recenzija

Ključne riječi
Nickel; nanoparticles; magnetron sputtering; silica; multilayers

Sažetak
Thin nickel films (2-16 nm) have been deposited onto monocrystalline (Si, sapphire) and glassy substrates (fused silica, glass) held at room temperature, 300°C, and 450°C, respectively. Further, Ni nanoparticles (NP) have been formed by codeposition of nickel and silica (or alumina), either in a single mixed layer, or as a multilayer (10 or 20 bilayers) stack which were subsequently annealed in order to improve the NP's crystallinity and 3-dim ordering. The nickel concentration within the mixed layers, dielectric spacer thickness, and substrate temperature were varied in these depositions, respectively. The prepared samples have been characterized by the appropriate methods: the average thickness of the pure Ni films and multilayer periodicity was determined by the XRR, while the film surface topography has been observed by the AFM and SEM. GISAXS measurements were performed at Sincrotrone Trieste, at 8 keV and with the 2-dim detector. Optical and magnetic properties of either surface Ni-nanoclusters or Ni-nanoparticles embedded into dielectric matrix have been probed, as well.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Projekt / tema
098-0982886-2895 - Novi amorfni i nanostrukturirani tankoslojni materijali (Nikola Radić, )

Ustanove
Institut za fiziku, Zagreb,
Institut "Ruđer Bošković", Zagreb