Pregled bibliografske jedinice broj: 51101
Quantitative Analysis of a-Si1-xCx:H Thin Films by Vibrational Spectroscopy and Nuclear Methods
Quantitative Analysis of a-Si1-xCx:H Thin Films by Vibrational Spectroscopy and Nuclear Methods // Vacuum, 61 (2001), 2-4; 303-308 (međunarodna recenzija, članak, znanstveni)
Naslov
Quantitative Analysis of a-Si1-xCx:H Thin Films by Vibrational Spectroscopy and Nuclear Methods
Autori
Gracin, Davor ; Bogdanović, Ivančica ; Borjanović, Vesna ; Jakšić, Milko ; Pastuović, Željko ; Dutta, J. M. ; Vlahović, Branislav ; Nemanich, R. J.
Izvornik
Vacuum (0042-207X) 61
(2001), 2-4;
303-308
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
Quantitative analysis; amorphous silicon carbide; FTIR; Raman; RBS; ERDA
Sažetak
Thin amorphous hydrogenated silicon-carbon films, a-Si1-xCx:H were deposited by magnetron sputtering on glass and mono-crystalline substrate with carbon content from x = 0.2 to x = 1, wide variation of hydrogen concentration and different degrees of structural ordering. The obtained films were investigated by FTIR (Fourier Transform Infra-Red) spectroscopy, Raman spectroscopy, RBS (Rutherford Backscattering) and ERDA (Elastic Recoil Detection Analysis). The results of the quantitative analyses obtained by the above-mentioned techniques were compared. It has been concluded that the applied vibrational methods can be used as quantitative which enables estimation of the degree of chemical ordering in the analysed samples.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
POVEZANOST RADA
Ustanove
Fakultet elektrotehnike i računarstva, Zagreb,
Institut "Ruđer Bošković", Zagreb
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus
Uključenost u ostale bibliografske baze podataka:
- The INSPEC Science Abstracts series