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Pregled bibliografske jedinice broj: 51101

Quantitative Analysis of a-Si1-xCx:H Thin Films by Vibrational Spectroscopy and Nuclear Methods


Gracin, Davor; Bogdanović, Ivančica; Borjanović, Vesna; Jakšić, Milko; Pastuović, Željko; Dutta, J. M.; Vlahović, Branislav; Nemanich, R. J.
Quantitative Analysis of a-Si1-xCx:H Thin Films by Vibrational Spectroscopy and Nuclear Methods // Vacuum, 61 (2001), 2-4; 303-308 (međunarodna recenzija, članak, znanstveni)


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Naslov
Quantitative Analysis of a-Si1-xCx:H Thin Films by Vibrational Spectroscopy and Nuclear Methods

Autori
Gracin, Davor ; Bogdanović, Ivančica ; Borjanović, Vesna ; Jakšić, Milko ; Pastuović, Željko ; Dutta, J. M. ; Vlahović, Branislav ; Nemanich, R. J.

Izvornik
Vacuum (0042-207X) 61 (2001), 2-4; 303-308

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
quantitative analysis; amorphous silicon carbide; FTIR; Raman; RBS; ERDA

Sažetak
Thin amorphous hydrogenated silicon-carbon films, a-Si1-xCx:H were deposited by magnetron sputtering on glass and mono-crystalline substrate with carbon content from x = 0.2 to x = 1, wide variation of hydrogen concentration and different degrees of structural ordering. The obtained films were investigated by FTIR (Fourier Transform Infra-Red) spectroscopy, Raman spectroscopy, RBS (Rutherford Backscattering) and ERDA (Elastic Recoil Detection Analysis). The results of the quantitative analyses obtained by the above-mentioned techniques were compared. It has been concluded that the applied vibrational methods can be used as quantitative which enables estimation of the degree of chemical ordering in the analysed samples.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Ustanove:
Fakultet elektrotehnike i računarstva, Zagreb,
Institut "Ruđer Bošković", Zagreb

Citiraj ovu publikaciju

Gracin, Davor; Bogdanović, Ivančica; Borjanović, Vesna; Jakšić, Milko; Pastuović, Željko; Dutta, J. M.; Vlahović, Branislav; Nemanich, R. J.
Quantitative Analysis of a-Si1-xCx:H Thin Films by Vibrational Spectroscopy and Nuclear Methods // Vacuum, 61 (2001), 2-4; 303-308 (međunarodna recenzija, članak, znanstveni)
Gracin, D., Bogdanović, I., Borjanović, V., Jakšić, M., Pastuović, Ž., Dutta, J., Vlahović, B. & Nemanich, R. (2001) Quantitative Analysis of a-Si1-xCx:H Thin Films by Vibrational Spectroscopy and Nuclear Methods. Vacuum, 61 (2-4), 303-308.
@article{article, year = {2001}, pages = {303-308}, keywords = {quantitative analysis, amorphous silicon carbide, FTIR, Raman, RBS, ERDA}, journal = {Vacuum}, volume = {61}, number = {2-4}, issn = {0042-207X}, title = {Quantitative Analysis of a-Si1-xCx:H Thin Films by Vibrational Spectroscopy and Nuclear Methods}, keyword = {quantitative analysis, amorphous silicon carbide, FTIR, Raman, RBS, ERDA} }
@article{article, year = {2001}, pages = {303-308}, keywords = {quantitative analysis, amorphous silicon carbide, FTIR, Raman, RBS, ERDA}, journal = {Vacuum}, volume = {61}, number = {2-4}, issn = {0042-207X}, title = {Quantitative Analysis of a-Si1-xCx:H Thin Films by Vibrational Spectroscopy and Nuclear Methods}, keyword = {quantitative analysis, amorphous silicon carbide, FTIR, Raman, RBS, ERDA} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus


Uključenost u ostale bibliografske baze podataka:


  • The INSPEC Science Abstracts series





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