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Pregled bibliografske jedinice broj: 50716

Structural properties of a-Si(1-x)C(x):H by SAXS and IR spectroscopy


Gracin, Davor; Dubček, Pavo
Structural properties of a-Si(1-x)C(x):H by SAXS and IR spectroscopy // Fizika A, 8 (1999), 3; 131-140 (podatak o recenziji nije dostupan, članak, znanstveni)


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Naslov
Structural properties of a-Si(1-x)C(x):H by SAXS and IR spectroscopy

Autori
Gracin, Davor ; Dubček, Pavo

Izvornik
Fizika A (1330-0008) 8 (1999), 3; 131-140

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
a-Si(1-x)C(x):H thin films; different carbon concentrations; DC magnetron sputtering; small angle X-ray scattering (SAXS); IR spectroscopy; stretching frequency of Si:H bonds; clusters of small voids

Sažetak
The a-Si(1-x)C(x):H thin films, with carbon concentrations up to x=0.3 deposited by means of a DC magnetron sputtering source, using benzene vapour as the origin of carbon atoms, were analysed by small-angle X-ray scattering (SAXS) and IR spectroscopy. The incorporation of carbon atoms in a-Si:H results in the appearance of IR absorption related to the Si-C and C-H bonds and a slight decrease of absorption related to Si-H bonds. By increaseing the carbon concentration, stretching frequency of Si-H bonds increases. This frequency, which is related to the described changes, is considered to be the consequence of an increasing void volume ratio and/or void volume per each Si-H oscillator. The SAXS data of pure a-Si:H indicate "particles" with giro radius Rg 0 1.27 nm, which increases with the carbon content up to Rg = 2.05 nm. These "particles" are attributed to the clusters of small voids with dimensions up to several vacancies.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Projekti:
00980302

Ustanove:
Institut "Ruđer Bošković", Zagreb

Profili:

Avatar Url Davor Gracin (autor)

Avatar Url Pavo Dubček (autor)

Citiraj ovu publikaciju

Gracin, Davor; Dubček, Pavo
Structural properties of a-Si(1-x)C(x):H by SAXS and IR spectroscopy // Fizika A, 8 (1999), 3; 131-140 (podatak o recenziji nije dostupan, članak, znanstveni)
Gracin, D. & Dubček, P. (1999) Structural properties of a-Si(1-x)C(x):H by SAXS and IR spectroscopy. Fizika A, 8 (3), 131-140.
@article{article, year = {1999}, pages = {131-140}, keywords = {a-Si(1-x)C(x):H thin films, different carbon concentrations, DC magnetron sputtering, small angle X-ray scattering (SAXS), IR spectroscopy, stretching frequency of Si:H bonds, clusters of small voids}, journal = {Fizika A}, volume = {8}, number = {3}, issn = {1330-0008}, title = {Structural properties of a-Si(1-x)C(x):H by SAXS and IR spectroscopy}, keyword = {a-Si(1-x)C(x):H thin films, different carbon concentrations, DC magnetron sputtering, small angle X-ray scattering (SAXS), IR spectroscopy, stretching frequency of Si:H bonds, clusters of small voids} }
@article{article, year = {1999}, pages = {131-140}, keywords = {a-Si(1-x)C(x):H thin films, different carbon concentrations, DC magnetron sputtering, small angle X-ray scattering (SAXS), IR spectroscopy, stretching frequency of Si:H bonds, clusters of small voids}, journal = {Fizika A}, volume = {8}, number = {3}, issn = {1330-0008}, title = {Structural properties of a-Si(1-x)C(x):H by SAXS and IR spectroscopy}, keyword = {a-Si(1-x)C(x):H thin films, different carbon concentrations, DC magnetron sputtering, small angle X-ray scattering (SAXS), IR spectroscopy, stretching frequency of Si:H bonds, clusters of small voids} }




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