engleski

Evaluating series resistance of amorphous silicon solar cells using one diode model with variable diode ideality factor

The various recombination and generation processes in the solar cell under illumination can be represented by two diodes with different exponential behaviour. Simplifying this model and using method based on one diode model with variable diode ideality factor series resistance of solar cell was evaluated. Series resistance is determined from measured I-U characteristics of amorphous silicon photovoltaic (PV) modules which are tested under real environmental conditions. Incidence irradiance on horizontal plane is measured by multipyranometer array and calculated incidence irradiance on the inclined plane. Using least square method implemented by Levenbrg-Marquard algorithm a dependence of the series resistance on the irradiance levels is derived. Disadvantages and possible improvements of this method are discussed.

series resistance solar cells; amorphous silicon solar cells; one diode model

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