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Analysis of Factors that Influence Micro-Resistance Measuring


Banovac, Eraldo; Kozak, Dražan
Analysis of Factors that Influence Micro-Resistance Measuring // Strojarstvo, 52 (2010), 3; 261-270 (međunarodna recenzija, članak, znanstveni)


Naslov
Analysis of Factors that Influence Micro-Resistance Measuring

Autori
Banovac, Eraldo ; Kozak, Dražan

Izvornik
Strojarstvo (0562-1887) 52 (2010), 3; 261-270

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
Dispersion analysis; micro-resistance measuring method; plated-through hole; thickness measuring

Sažetak
The micro-resistance measuring principle with specific forms of current distribution in the plated through-hole of printed circuit board (PCB) is analyzed in this paper. Special attention is paid to the following factors that influence the micro-resistance measuring: the hole diameter, the type of the measuring probe and the PCB thickness, and their two and three-factor interactions. The experiment with three repetition of measurement is carried out for which the dispersion analysis includes: the calculated values of the sum of the square of deviation, the mean of the square of deviation and a comparison between the calculated factors and the relevant factor given for five percent α-risk. The results of the dispersion analysis clearly indicate that the strongest factor that influences the micro-resistance measures is the PCB thickness. The overall conclusion is that the effect of each considered factor to the micro-resistance measures is expressive, but the effect of their mutual interactions is not significant in the measuring practice.

Izvorni jezik
Engleski

Znanstvena područja
Elektrotehnika, Strojarstvo



POVEZANOST RADA


Projekt / tema
152-1201910-1909 - Analiza i procjena loma konstrukcija iz anizotropnih materijala (Dražan Kozak, )

Ustanove
Strojarski fakultet, Slavonski Brod

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus


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