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General approach to reliable characterization of thin metal films


Amotchkina, Tatiana V.; Janicki, Vesna; Sancho-Parramon, Jordi; Tikhonravov, Alexander V.; Trubetskov, Michael K.; Zorc, Hrvoje
General approach to reliable characterization of thin metal films // Applied optics (2004), 50 (2011), 10; 1453-1464 doi:10.1364/AO.50.001453 (međunarodna recenzija, članak, znanstveni)


Naslov
General approach to reliable characterization of thin metal films

Autori
Amotchkina, Tatiana V. ; Janicki, Vesna ; Sancho-Parramon, Jordi ; Tikhonravov, Alexander V. ; Trubetskov, Michael K. ; Zorc, Hrvoje

Izvornik
Applied optics (2004) (1559-128X) 50 (2011), 10; 1453-1464

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
metal films; surface plasmons; ellipsometry; optical characterization

Sažetak
Optical constants of thin metal films are strongly dependent on deposition conditions, growth mode, and thickness. We propose a universal characterization approach that allows reliable determination of thin metal film optical constants as functions of wavelength and thickness. We apply this approach to determination of refractive index dispersion of silver island films embedded between silica layers.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Projekt / tema
098-0000000-3191 - Optička svojstva nanostrukturnih slojeva (Hrvoje Zorc, )

Ustanove
Institut "Ruđer Bošković", Zagreb

Profili:

Avatar Url Jordi Sancho Parramon (autor)

Avatar Url Vesna Janicki (autor)

Avatar Url Hrvoje Zorc (autor)

Citiraj ovu publikaciju

Amotchkina, Tatiana V.; Janicki, Vesna; Sancho-Parramon, Jordi; Tikhonravov, Alexander V.; Trubetskov, Michael K.; Zorc, Hrvoje
General approach to reliable characterization of thin metal films // Applied optics (2004), 50 (2011), 10; 1453-1464 doi:10.1364/AO.50.001453 (međunarodna recenzija, članak, znanstveni)
Amotchkina, T., Janicki, V., Sancho-Parramon, J., Tikhonravov, A., Trubetskov, M. & Zorc, H. (2011) General approach to reliable characterization of thin metal films. Applied optics (2004), 50 (10), 1453-1464 doi:10.1364/AO.50.001453.
@article{article, year = {2011}, pages = {1453-1464}, DOI = {10.1364/AO.50.001453}, keywords = {metal films, surface plasmons, ellipsometry, optical characterization}, journal = {Applied optics (2004)}, doi = {10.1364/AO.50.001453}, volume = {50}, number = {10}, issn = {1559-128X}, title = {General approach to reliable characterization of thin metal films}, keyword = {metal films, surface plasmons, ellipsometry, optical characterization} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus


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