Al-mediated Solid-Phase Epitaxy of Silicon-On- Insulator (CROSBI ID 568824)
Prilog sa skupa u zborniku | izvorni znanstveni rad | međunarodna recenzija
Podaci o odgovornosti
Šakić, Agata ; Civale, Yann ; Nanver, Lis K. ; Biasotto, Cleber ; Jovanović, Vladimir
engleski
Al-mediated Solid-Phase Epitaxy of Silicon-On- Insulator
Silicon-on-insulator (SOI) regions have been grown on lithographically predetermined positions by Al- mediated Solid-Phase Epitaxy (SPE) of amorphous silicon (α-Si). A controllable Si lateral overgrowth is induced from windows formed in silicon dioxide (SiO2) to the crystalline Si substrate. The resulting hundred-of-nanometer large areas of high-quality monocrystalline SOI are formed at the temperatures that can be as low as 400 °C. The as-obtained SOI regions were found to take on the same crystal orientation as the (100)-Si substrate and have the ability to merge seamlessly over the oxide.
silicon-on-insulator; solid-phase epitaxy; aluminum mediated
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Podaci o prilogu
427-432.
2010.
objavljeno
Podaci o matičnoj publikaciji
Materials Research Society Symposium Proceedings, Volume 1245
Wang, Qi ; Yan, Baojie ; Flewitt, Andrew ; Tsai, Chuang-Chuang ; Higashi, Seiichiro
Warrendale (PA): Materials Research Society
978-1-60511-222-0
Podaci o skupu
Materials Research Society Spring Meeteing
predavanje
05.04.2010-09.04.2010
San Francisco (CA), Sjedinjene Američke Države