Nalazite se na CroRIS probnoj okolini. Ovdje evidentirani podaci neće biti pohranjeni u Informacijskom sustavu znanosti RH. Ako je ovo greška, CroRIS produkcijskoj okolini moguće je pristupi putem poveznice www.croris.hr
izvor podataka: crosbi !

Al-mediated Solid-Phase Epitaxy of Silicon-On- Insulator (CROSBI ID 568824)

Prilog sa skupa u zborniku | izvorni znanstveni rad | međunarodna recenzija

Šakić, Agata ; Civale, Yann ; Nanver, Lis K. ; Biasotto, Cleber ; Jovanović, Vladimir Al-mediated Solid-Phase Epitaxy of Silicon-On- Insulator // Materials Research Society Symposium Proceedings, Volume 1245 / Wang, Qi ; Yan, Baojie ; Flewitt, Andrew et al. (ur.). Warrendale (PA): Materials Research Society, 2010. str. 427-432

Podaci o odgovornosti

Šakić, Agata ; Civale, Yann ; Nanver, Lis K. ; Biasotto, Cleber ; Jovanović, Vladimir

engleski

Al-mediated Solid-Phase Epitaxy of Silicon-On- Insulator

Silicon-on-insulator (SOI) regions have been grown on lithographically predetermined positions by Al- mediated Solid-Phase Epitaxy (SPE) of amorphous silicon (α-Si). A controllable Si lateral overgrowth is induced from windows formed in silicon dioxide (SiO2) to the crystalline Si substrate. The resulting hundred-of-nanometer large areas of high-quality monocrystalline SOI are formed at the temperatures that can be as low as 400 °C. The as-obtained SOI regions were found to take on the same crystal orientation as the (100)-Si substrate and have the ability to merge seamlessly over the oxide.

silicon-on-insulator; solid-phase epitaxy; aluminum mediated

nije evidentirano

nije evidentirano

nije evidentirano

nije evidentirano

nije evidentirano

nije evidentirano

Podaci o prilogu

427-432.

2010.

objavljeno

Podaci o matičnoj publikaciji

Materials Research Society Symposium Proceedings, Volume 1245

Wang, Qi ; Yan, Baojie ; Flewitt, Andrew ; Tsai, Chuang-Chuang ; Higashi, Seiichiro

Warrendale (PA): Materials Research Society

978-1-60511-222-0

Podaci o skupu

Materials Research Society Spring Meeteing

predavanje

05.04.2010-09.04.2010

San Francisco (CA), Sjedinjene Američke Države

Povezanost rada

Elektrotehnika