Capacitance changes in neutron irradiated n-type silicon: The flux effect (CROSBI ID 164521)
Prilog u časopisu | izvorni znanstveni rad | međunarodna recenzija
Podaci o odgovornosti
Novoselnik, Branimir ; Pilipovic, Marko ; Jaćimović, Radojko ; Pivac, Branko ; Slunjski, Robert ; Capan, Ivana
engleski
Capacitance changes in neutron irradiated n-type silicon: The flux effect
The influence of fast neutron flux on radiation-induced capacitance changes in heavily irradiated n-type Si has been studied by means of capacitance techniques. We have observed two regimes ; flux-dependent and -independent for the case of high and low flux irradiation, respectively. A model that describes changes in the thermally stimulated capacitance as a function of time of irradiation has been proposed.
silicon ; irradiation ; neutron ; flux ; capacitance
nije evidentirano
nije evidentirano
nije evidentirano
nije evidentirano
nije evidentirano
nije evidentirano
Podaci o izdanju
268 (15)
2010.
2400-2402
objavljeno
0168-583X
1872-9584
10.1016/j.nimb.2010.04.017
