IBIC characterisation of defect structures in polycrystalline silicon (CROSBI ID 475176)
Prilog sa skupa u zborniku | sažetak izlaganja sa skupa
Podaci o odgovornosti
Jakšić, Milko ; Pastuović, Željko ; Pivac, Branko ; Borjanović, Vesna
engleski
IBIC characterisation of defect structures in polycrystalline silicon
The physics of silicon solar cell device imposes very stringent requirements on the electrical properties of material. A pressure to lower the cost of the substance brings the novel material to be processed with a fairly inexpensive techology.
polycrystalline silicon
nije evidentirano
nije evidentirano
nije evidentirano
nije evidentirano
nije evidentirano
nije evidentirano
Podaci o prilogu
33-33.
2000.
objavljeno
Podaci o matičnoj publikaciji
7th International Conference on Nuclear Microprobe Technology and Applications, Final Program and Abstracts
Bordeaux: ICNMTA 2000
Podaci o skupu
7th International Conference on Nuclear Microprobe Technology and Applications
predavanje
10.09.2000-15.09.2000
Bordeaux, Francuska
