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Pregled bibliografske jedinice broj: 456035

X-ray diffraction examination of structure and stability of amorphous Cu--W thin films


Gržeta, Biserka; Radić, Nikola; Gracin, Davor; Došlić, Tomislav
X-ray diffraction examination of structure and stability of amorphous Cu--W thin films // Material Science Forum, 133-136 (1993), 913-919 (podatak o recenziji nije dostupan, članak, znanstveni)


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Naslov
X-ray diffraction examination of structure and stability of amorphous Cu--W thin films

Autori
Gržeta, Biserka ; Radić, Nikola ; Gracin, Davor ; Došlić, Tomislav

Izvornik
Material Science Forum (0255-5476) 133-136 (1993); 913-919

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
amorphous alloys; thin films

Sažetak
Detailed studies of the structure of the amorphous Cu - W thin films deposited by magnetron sputtering have been performed by X-ray diffraction at 300 K.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Ustanove:
Građevinski fakultet, Zagreb

Profili:

Avatar Url Davor Gracin (autor)

Avatar Url Nikola Radić (autor)

Avatar Url Biserka Gržeta (autor)

Avatar Url Tomislav Došlić (autor)

Citiraj ovu publikaciju

Gržeta, Biserka; Radić, Nikola; Gracin, Davor; Došlić, Tomislav
X-ray diffraction examination of structure and stability of amorphous Cu--W thin films // Material Science Forum, 133-136 (1993), 913-919 (podatak o recenziji nije dostupan, članak, znanstveni)
Gržeta, B., Radić, N., Gracin, D. & Došlić, T. (1993) X-ray diffraction examination of structure and stability of amorphous Cu--W thin films. Material Science Forum, 133-136, 913-919.
@article{article, year = {1993}, pages = {913-919}, keywords = {amorphous alloys, thin films}, journal = {Material Science Forum}, volume = {133-136}, issn = {0255-5476}, title = {X-ray diffraction examination of structure and stability of amorphous Cu--W thin films}, keyword = {amorphous alloys, thin films} }
@article{article, year = {1993}, pages = {913-919}, keywords = {amorphous alloys, thin films}, journal = {Material Science Forum}, volume = {133-136}, issn = {0255-5476}, title = {X-ray diffraction examination of structure and stability of amorphous Cu--W thin films}, keyword = {amorphous alloys, thin films} }




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