Direct observation of defects in hexagonal boron nitride by near- edge X-ray absorption fine structure and X-ray photoemission spectroscopy (CROSBI ID 159965)
Prilog u časopisu | izvorni znanstveni rad | međunarodna recenzija
Podaci o odgovornosti
Petravić, Mladen ; Peter, Robert ; Fan, Liang-Jen ; Yang, Yaw-Wen ; Chen, Ying
engleski
Direct observation of defects in hexagonal boron nitride by near- edge X-ray absorption fine structure and X-ray photoemission spectroscopy
Formation of defects in hexagonal boron nitride (h-BN) under low-energy argon or nitrogen ion bombardment has been studied by near-edge X-ray absorption fine structure (NEXAFS) around boron and nitrogen K-edges and X-ray photoemission spectroscopy (XPS) from B1s and N1s core levels. Breaking of B–N bonds and formation of nitrogen vacancies have been identified in the B K-edge NEXAFS and B1s XPS measurements, followed by the formation of molecular nitrogen, N2, at interstitial positions for both argon and nitrogen bombardments. The formation of N2 produces a sharp resonance in the low-resolution NEXAFS spectra around the N K-edge, showing characteristic vibrational fine structure in high-resolution measurements.
boron nitride; NEXAFS; XPS; point defects
Rad je prezentiran na skupu 11th International Symposium on Radiation Physics : Frontiers in radiation physics and applications.
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Podaci o izdanju
619 (1/3)
2010.
94-97
objavljeno
0168-9002
10.1016/j.nima.2009.10.118