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Direct observation of defects in hexagonal boron nitride by near- edge X-ray absorption fine structure and X-ray photoemission spectroscopy (CROSBI ID 159965)

Prilog u časopisu | izvorni znanstveni rad | međunarodna recenzija

Petravić, Mladen ; Peter, Robert ; Fan, Liang-Jen ; Yang, Yaw-Wen ; Chen, Ying Direct observation of defects in hexagonal boron nitride by near- edge X-ray absorption fine structure and X-ray photoemission spectroscopy // Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 619 (2010), 1/3; 94-97. doi: 10.1016/j.nima.2009.10.118

Podaci o odgovornosti

Petravić, Mladen ; Peter, Robert ; Fan, Liang-Jen ; Yang, Yaw-Wen ; Chen, Ying

engleski

Direct observation of defects in hexagonal boron nitride by near- edge X-ray absorption fine structure and X-ray photoemission spectroscopy

Formation of defects in hexagonal boron nitride (h-BN) under low-energy argon or nitrogen ion bombardment has been studied by near-edge X-ray absorption fine structure (NEXAFS) around boron and nitrogen K-edges and X-ray photoemission spectroscopy (XPS) from B1s and N1s core levels. Breaking of B–N bonds and formation of nitrogen vacancies have been identified in the B K-edge NEXAFS and B1s XPS measurements, followed by the formation of molecular nitrogen, N2, at interstitial positions for both argon and nitrogen bombardments. The formation of N2 produces a sharp resonance in the low-resolution NEXAFS spectra around the N K-edge, showing characteristic vibrational fine structure in high-resolution measurements.

boron nitride; NEXAFS; XPS; point defects

Rad je prezentiran na skupu 11th International Symposium on Radiation Physics : Frontiers in radiation physics and applications.

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Podaci o izdanju

619 (1/3)

2010.

94-97

objavljeno

0168-9002

10.1016/j.nima.2009.10.118

Povezanost rada

Fizika

Poveznice
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