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Pregled bibliografske jedinice broj: 441612

X-ray tracing study of crystal spectrometers for WDXRS application


Tadić, Tonči; Jakšić, Milko; Božičević, Iva
X-ray tracing study of crystal spectrometers for WDXRS application // X-ray spectrometry, 38 (2009), 222-228 doi:10.1002/xrs.1155 (međunarodna recenzija, članak, znanstveni)


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Naslov
X-ray tracing study of crystal spectrometers for WDXRS application

Autori
Tadić, Tonči ; Jakšić, Milko ; Božičević, Iva

Izvornik
X-ray spectrometry (0049-8246) 38 (2009); 222-228

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
WDX ; crystal spectrometer ; X-ray tracing

Sažetak
Construction of a high energy resolution crystal X-ray spectrometer to be used for wavelength-dispersive X-ray emission spectroscopy (WDXRS) may result in different geometrical aberrations, such as systematic X-ray line shifts and changes of the X-ray line shape. Most of these aberrations can be reduced by careful design of a crystal spectrometer, keeping the efficiency of the spectrometer as high as possible. The availability of high-resolution position-sensitive detectors and small excitation beam sizes, and therefore a possible downsized Wavelength-dispersive X-ray (WDX) spectrometer, increase the need for reliable simulation of aberrations involved in WDXRS. Since the experimental investigation of the impact that WDX spectrometer design has on a particular aberration is rather time-consuming, a numerical X-ray tracing procedure, XTRACE, has been developed and applied for this purpose. Results are given in the form of virtual X-ray energy spectra that have been affected by the most important aberrations.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Projekti:
098-1191005-2876 - Procesi interakcije ionskih snopova i nanostrukture (Jakšić, Milko, MZOS ) ( POIROT)

Ustanove:
Institut "Ruđer Bošković", Zagreb

Citiraj ovu publikaciju

Tadić, Tonči; Jakšić, Milko; Božičević, Iva
X-ray tracing study of crystal spectrometers for WDXRS application // X-ray spectrometry, 38 (2009), 222-228 doi:10.1002/xrs.1155 (međunarodna recenzija, članak, znanstveni)
Tadić, T., Jakšić, M. & Božičević, I. (2009) X-ray tracing study of crystal spectrometers for WDXRS application. X-ray spectrometry, 38, 222-228 doi:10.1002/xrs.1155.
@article{article, year = {2009}, pages = {222-228}, DOI = {10.1002/xrs.1155}, keywords = {WDX, crystal spectrometer, X-ray tracing}, journal = {X-ray spectrometry}, doi = {10.1002/xrs.1155}, volume = {38}, issn = {0049-8246}, title = {X-ray tracing study of crystal spectrometers for WDXRS application}, keyword = {WDX, crystal spectrometer, X-ray tracing} }
@article{article, year = {2009}, pages = {222-228}, DOI = {10.1002/xrs.1155}, keywords = {WDX, crystal spectrometer, X-ray tracing}, journal = {X-ray spectrometry}, doi = {10.1002/xrs.1155}, volume = {38}, issn = {0049-8246}, title = {X-ray tracing study of crystal spectrometers for WDXRS application}, keyword = {WDX, crystal spectrometer, X-ray tracing} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus


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