Napredna pretraga

Pregled bibliografske jedinice broj: 41553

Complete set of deep traps in semi-insulating GaAs


Pavlović, Mladen; Desnica, Uroš; Gladić, Jadranko
Complete set of deep traps in semi-insulating GaAs // Journal of applied physics, 88 (2000), 8; 4563-4570 (međunarodna recenzija, članak, znanstveni)


Naslov
Complete set of deep traps in semi-insulating GaAs

Autori
Pavlović, Mladen ; Desnica, Uroš ; Gladić, Jadranko

Izvornik
Journal of applied physics (0021-8979) 88 (2000), 8; 4563-4570

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
Defects; deep traps; semi-insulating GaAs

Sažetak
Reevaluation and recalculacion of thermally stimulated current (TSC) data from semi-insulating (SI) GaAs, published by many different authors over a period of three decades were done by means of the new analytical method, simultaneous multiple peak analysis (SIMPA). The SIMPA procedure clearly resolved contributions from various overlapping TSC peaks and enabled the precise determination of signatures (activation energy, Ea and capture cross section, sigma) of all oserved deep traps. The analysed TSC spectra refer to SI GaAs samples that have been grown/treated in quite different ways (various growth techniques, growth under As or Ga rich conditions, different annealing procedures, irradiation with neutrons, gamma rays, ect.). Although the SIMPA procedure was applied to apparently quite different TSC spectra, in all cases excellent fits were achieved, with the unique set (or subset from it) of eleven different deep traps, the only difference being in relative and absolute concentrations of traps. Despite a broad variety of samples analyzed in this article, the set of deep traps obtained is the same as the one being previously seen in the narrow range of SI GaAs samples. This finding suggests that this set of traps is a finite and complete set of all defects with deep levels in SI GaAs. It was also concluded that these defects are primarily complexes containing simple native defects.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Projekt / tema
00350106
00980301

Ustanove
Institut za fiziku, Zagreb,
Institut "Ruđer Bošković", Zagreb

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus