Napredna pretraga

Pregled bibliografske jedinice broj: 402071

Extending Lexical Association Measures for Collocation Extraction

Petrović, Saša; Šnajder, Jan; Dalbelo Bašić, Bojana
Extending Lexical Association Measures for Collocation Extraction // Computer Speech and Language, 24 (2010), 2; 383-394 doi:10.1016/j.csl.2009.06.001 (međunarodna recenzija, članak, znanstveni)

Extending Lexical Association Measures for Collocation Extraction

Petrović, Saša ; Šnajder, Jan ; Dalbelo Bašić, Bojana

Computer Speech and Language (0885-2308) 24 (2010), 2; 383-394

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
Collocations; collocation extraction; lexical association measures

Collocations are linguistic phenomena that occur when two or more words appear together more often than by chance and whose meaning often cannot be inferred from the meanings of its parts. As collocations have found many applications in the fields of natural language processing, information retrieval, and text mining, extracting them from large corpora has been the focus of many studies over the past few years. In this paper, we introduce the notion of an extension pattern, a formalization of the idea of extending lexical association measures (AMs) defined for bigrams. An extension pattern provides a measure-independent way of extending AMs for extracting collocations of arbitrary length. We define different extension patterns and compare them on a task of extracting collocations from a newspaper corpus. We show that the stopword-sensitive extension patterns we propose outperform other extensions, which indicates that AMs could benefit by taking into account linguistic information about an n-grams's part-of-speech pattern.

Izvorni jezik

Znanstvena područja


Projekt / tema
036-1300646-1986 - Otkrivanje znanja u tekstnim podacima (Bojana Dalbelo-Bašić, )

Fakultet elektrotehnike i računarstva, Zagreb

Časopis indeksira:

  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus