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Thermionic Emission Process in Carrier Transport in pn Homojunctions (CROSBI ID 473282)

Prilog sa skupa u zborniku | izvorni znanstveni rad | međunarodna recenzija

Biljanović, Petar ; Suligoj, Tomislav Thermionic Emission Process in Carrier Transport in pn Homojunctions // Proceedings of MELECON 2000, Vol. I / Economides, Costas ; Pattichis, Constantinos S. ; Maliotis, Greg (ur.). Limassol: Institute of Electrical and Electronics Engineers (IEEE), 2000. str. 248-251-x

Podaci o odgovornosti

Biljanović, Petar ; Suligoj, Tomislav

engleski

Thermionic Emission Process in Carrier Transport in pn Homojunctions

Thermionic emission is treated in pn homojunctions. Thermionic current over pn junction barrier is derived directly from Maxwell-Boltzmann distribution function as a difference between the majority carrier flow and the flow of excess carriers in the opposite direction. It is shown that the excess carrier concentration is determined as an equilibrium between thermionic and diffusion process, which depends on quasi-neutral regions. Such an approach enables the determination of boundary condition for any doping profile.

thermionic emission; Maxwell-Boltzmann distribution function; quasi-neutral region; doping profile

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Podaci o prilogu

248-251-x.

2000.

objavljeno

Podaci o matičnoj publikaciji

Proceedings of MELECON 2000, Vol. I

Economides, Costas ; Pattichis, Constantinos S. ; Maliotis, Greg

Limassol: Institute of Electrical and Electronics Engineers (IEEE)

Podaci o skupu

MEleCon 2000 - 10 th Mediterranean Electrotechnical Conference

predavanje

29.05.2000-31.05.2000

Nikozija, Cipar

Povezanost rada

Elektrotehnika