Mesh Structure Adjustment in 2D Simulation of VLSI Super Self-Aligned Si Bipolar Transistor (CROSBI ID 473265)
Prilog sa skupa u zborniku | izvorni znanstveni rad | međunarodna recenzija
Podaci o odgovornosti
Suligoj, Tomislav ; Biljanović, Petar
engleski
Mesh Structure Adjustment in 2D Simulation of VLSI Super Self-Aligned Si Bipolar Transistor
A fabrication process of high-speed, deep-trench, double polysilicon super self-aligned silicon bipolar transistor is simulated by 2D simulation program, assuming 0,25 *m design rules. The effect of simulation mesh on doping profiles of intrinsic and extrinsic transistor, deposited layers and electrical characteristics simulation model are analyzed.
fabrication process; super self-aligned silicon bipolar transistor; 2D simulation program; simulation mesh
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Podaci o prilogu
1167-1172-x.
1999.
objavljeno
Podaci o matičnoj publikaciji
1999 IEEE Africon
Podaci o skupu
1999 IEEE Africon, 5Čth Africon Conference in Africa
predavanje
28.09.1999-01.10.1999
Cape Town, Južnoafrička Republika