Pretražite po imenu i prezimenu autora, mentora, urednika, prevoditelja

Napredna pretraga

Pregled bibliografske jedinice broj: 376836

Correlating Raman-spectroscopy and high-resolution transmission-electron-microscopy studies of amorphous/nanocrystalline multilayered silicon thin films


Gajović, Andreja; Gracin, Davor; Juraić, Krunoslav; Sancho-Parramon, Jordi; Čeh, Miran
Correlating Raman-spectroscopy and high-resolution transmission-electron-microscopy studies of amorphous/nanocrystalline multilayered silicon thin films // Thin solid films, 517 (2009), 18; 5453-5458 doi:10.1016/j.tsf.2009.01.086 (međunarodna recenzija, članak, znanstveni)


CROSBI ID: 376836 Za ispravke kontaktirajte CROSBI podršku putem web obrasca

Naslov
Correlating Raman-spectroscopy and high-resolution transmission-electron-microscopy studies of amorphous/nanocrystalline multilayered silicon thin films

Autori
Gajović, Andreja ; Gracin, Davor ; Juraić, Krunoslav ; Sancho-Parramon, Jordi ; Čeh, Miran

Izvornik
Thin solid films (0040-6090) 517 (2009), 18; 5453-5458

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
Silicon ; Nanostructures ; Electron microscopy ; Raman scattering

Sažetak
The nanostructure of multilayered silicon thin films was studied using Raman spectroscopy (RS) and high-resolution transmission electron microscopy (HRTEM). Since the properties of nanocristalline silicon (nc-Si) layer depend on the size of the nanocrystals, an accurate determination of the crystallite sizes and the crystalline fraction for nc-Si is of primary importance. The average sizes of the nanocrystals estimated by RS, assuming bi-modal distribution of crystal sizes, were close to 2 nm and above 5-20 nm. HRTEM confirmed the existence of nanocrystals with a mean square value of around 2 nm and certain number of larger nanocrystals, embedded in amorphous matrix. The correlation between the results obtained by these two techniques is discussed. The optical properties of measured samples corresponded to amorphous-crystalline mixture with indication of confinement effects related to 2 nm nanocrystals.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Projekti:
098-0982886-2894 - Tanki filmovi legura silicija na prijelazu iz amorfne u uređenu strukturu (Gracin, Davor, MZOS ) ( POIROT)
098-0982904-2898 - Fizika i primjena nanostruktura i volumne tvari (Ivanda, Mile, MZOS ) ( POIROT)

Ustanove:
Institut "Ruđer Bošković", Zagreb

Poveznice na cjeloviti tekst rada:

doi www.sciencedirect.com doi.org

Citiraj ovu publikaciju:

Gajović, Andreja; Gracin, Davor; Juraić, Krunoslav; Sancho-Parramon, Jordi; Čeh, Miran
Correlating Raman-spectroscopy and high-resolution transmission-electron-microscopy studies of amorphous/nanocrystalline multilayered silicon thin films // Thin solid films, 517 (2009), 18; 5453-5458 doi:10.1016/j.tsf.2009.01.086 (međunarodna recenzija, članak, znanstveni)
Gajović, A., Gracin, D., Juraić, K., Sancho-Parramon, J. & Čeh, M. (2009) Correlating Raman-spectroscopy and high-resolution transmission-electron-microscopy studies of amorphous/nanocrystalline multilayered silicon thin films. Thin solid films, 517 (18), 5453-5458 doi:10.1016/j.tsf.2009.01.086.
@article{article, author = {Gajovi\'{c}, Andreja and Gracin, Davor and Jurai\'{c}, Krunoslav and Sancho-Parramon, Jordi and \v{C}eh, Miran}, year = {2009}, pages = {5453-5458}, DOI = {10.1016/j.tsf.2009.01.086}, keywords = {Silicon, Nanostructures, Electron microscopy, Raman scattering}, journal = {Thin solid films}, doi = {10.1016/j.tsf.2009.01.086}, volume = {517}, number = {18}, issn = {0040-6090}, title = {Correlating Raman-spectroscopy and high-resolution transmission-electron-microscopy studies of amorphous/nanocrystalline multilayered silicon thin films}, keyword = {Silicon, Nanostructures, Electron microscopy, Raman scattering} }
@article{article, author = {Gajovi\'{c}, Andreja and Gracin, Davor and Jurai\'{c}, Krunoslav and Sancho-Parramon, Jordi and \v{C}eh, Miran}, year = {2009}, pages = {5453-5458}, DOI = {10.1016/j.tsf.2009.01.086}, keywords = {Silicon, Nanostructures, Electron microscopy, Raman scattering}, journal = {Thin solid films}, doi = {10.1016/j.tsf.2009.01.086}, volume = {517}, number = {18}, issn = {0040-6090}, title = {Correlating Raman-spectroscopy and high-resolution transmission-electron-microscopy studies of amorphous/nanocrystalline multilayered silicon thin films}, keyword = {Silicon, Nanostructures, Electron microscopy, Raman scattering} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus


Citati:





    Contrast
    Increase Font
    Decrease Font
    Dyslexic Font