Quantitative phase analysis using the reference intensities or the whole XRD pattern (CROSBI ID 472585)
Prilog sa skupa u zborniku | sažetak izlaganja sa skupa | međunarodna recenzija
Podaci o odgovornosti
Gržeta, Biserka
engleski
Quantitative phase analysis using the reference intensities or the whole XRD pattern
A new procedure for quantitative X-ray diffraction phase analysis based on the matrix-flushing principle [1] is proposed. The method involves preparation of (i) a mixture of examined multicomponent system and corundum at the one-to-one weight ratio, and (ii) a mixture of a pure component, the weight fraction of which is to be determined - say X, and corundum at the one-to-one weight ratio. There follow two approaches of X-ray diffraction analysis procedure. In the first one the intensities of the strongest diffraction line of the component X and of corundum are to be measured for both mixtures (i) and (ii). The weight fraction of the component X is related to the ratios of integrated intensities of the strongest lines of that component and corundum for the mixture (i) and mixture (ii). The second approach uses the whole XRD powder patterns of the mixtures (i) and (ii), and involves the whole-powder-pattern decomposition of these patterns. The weight fraction of the component X is then related to the ratios of the sum of all diffracted intensities for the component X and the sum of all diffracted intensities for corundum, in both mixtures (i) and (ii) respectively. Examples were worked out using the fitting programs PROFIT and WPPF [2]. For quick result the first analysis approach gives satisfactory accuracy, but for more accurate result the latter one is better. The author expresses gratitude to Professor H. Toraya for kindly providing his computer programs.
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Podaci o prilogu
103-x.
1999.
objavljeno
Podaci o matičnoj publikaciji
VIIIth IUCr Congress, Abstracts
Wilson, C.C. ; Shankland, K., Csoka, T.
Glasgow: International Union of Crystallography
Podaci o skupu
18th Congress of the International Union of Crystallography
poster
04.08.1999-13.08.1999
Glasgow, Ujedinjeno Kraljevstvo