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Pregled bibliografske jedinice broj: 375184

Comparison of current-voltage characteristics for hypothetic Si and SiC bipolar junction transistor


Matić, Tomislav; Švedek, Tomislav; Herceg, Marijan
Comparison of current-voltage characteristics for hypothetic Si and SiC bipolar junction transistor // Elektrotehniški vestnik, 75 (2008), 3; 97-104 (međunarodna recenzija, članak, znanstveni)


Naslov
Comparison of current-voltage characteristics for hypothetic Si and SiC bipolar junction transistor

Autori
Matić, Tomislav ; Švedek, Tomislav ; Herceg, Marijan

Izvornik
Elektrotehniški vestnik (0013-5852) 75 (2008), 3; 97-104

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
Silicon carbide; PN diode; BJT transistor; temperature characteristic; Ebers-Moll model

Sažetak
The paper presents a model developed for numerical simulation of temperature dependence of a hypothetical Si and SiC diode and BJT current-voltage characteristics. A classical Si PN wide-base diode model and an E-M BJT model are used with SiC semiconductor-specific parameters. Intrinsic carrier concentrations, carrier mobility temperature and doping concentration dependence are calculated for both semiconductors. The obtained current-voltage characteristics are compared and their temperature dependence is discussed. A hypothetic SiC PN diode has a much higher knee voltage and a wider extrinsic or operating temperature range, and the same applies to SiC BJT, which altogether makes SiC devices more appropriate for high-temperature and high-power applications.

Izvorni jezik
Engleski

Znanstvena područja
Elektrotehnika, Računarstvo



POVEZANOST RADA


Projekt / tema
165-0361630-3049 - Napredni sustavi radijskog pristupa zatvorenom prostoru i interakcija s okolišem (Tomislav Švedek, )
165-0362027-1479 - Širokopojasni pristup i internetske usluge u ruralnim područjima (Drago Žagar, )
165-0362980-2002 - Postupci raspoređivanja u samoodrživim raspodijeljenim računalnim sustavima (Goran Martinović, )

Ustanove
Fakultet elektrotehnike, računarstva i informacijskih tehnologija Osijek

Časopis indeksira:


  • Scopus


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  • Compendex (EI Village)
  • INSPEC