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Pregled bibliografske jedinice broj: 371790

Technique for sensitive carbon depth profiling in thin samples using C-C elastic scattering


Bogdanović-Radović, Ivančica; Jakšić, Milko; Schiettekatte, Francois
Technique for sensitive carbon depth profiling in thin samples using C-C elastic scattering // Journal of analytical atomic spectrometry, 24 (2009), 2; 194-198 doi:10.1039/B810316J (međunarodna recenzija, članak, znanstveni)


Naslov
Technique for sensitive carbon depth profiling in thin samples using C-C elastic scattering

Autori
Bogdanović-Radović, Ivančica ; Jakšić, Milko ; Schiettekatte, Francois

Izvornik
Journal of analytical atomic spectrometry (0267-9477) 24 (2009), 2; 194-198

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
Elastic scattering ; carbon-carbon scattering

Sažetak
A technique for carbon depth profiling in thin samples is described. It is developed to analyze low concentrations of carbon in heavier matrices. The method is based on the carbon-carbon elastic scattering coincidence measurement. Recoiled carbon atoms as well as scattered carbon ions from the primary beam are detected by two solid state detectors placed symmetrically at 45° around the beam direction. Since scattering products are detected in forward direction, method can be applied only for transmission samples with thicknesses of the order of several micrometers. Capabilities of the technique concerning depth resolution and sensitivity were tested on samples with known composition and depth distribution of carbon.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Projekt / tema
098-1191005-2876 - Procesi interakcije ionskih snopova i nanostrukture (Milko Jakšić, )

Ustanove
Institut "Ruđer Bošković", Zagreb

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus


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