High-energy resolution PIXE study of heat induced changes in cadmium compounds using ion microbeam (CROSBI ID 85650)
Prilog u časopisu | izvorni znanstveni rad | međunarodna recenzija
Podaci o odgovornosti
Tadić, Tonči ; Mokuno, Y. ; Horino, Y. ; Jakšić, Milko ; Desnica-Franković, Dunja Ida ; Trojko, Rudolf
engleski
High-energy resolution PIXE study of heat induced changes in cadmium compounds using ion microbeam
The intensity changes of satellite X-ray line spectra can be related to the changes in the chemical environment of atoms in the sample. High-energy resolution PIXE analysis of chemical effects in X-ray spectra of Cd L lines was applied in studies of heat-treated CdS and CdTe cadmium compounds. The applicability of the method for monitoring crystal phases and chemical states in these and other materials using ion microbeam with high energy resolution PIXE spectrometer is discussed.
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Podaci o izdanju
158 (1-4)
1999.
241-244-x
objavljeno
0168-583X
