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Pregled bibliografske jedinice broj: 360915

Mapping the spatial distribution of charge carriers in LaAlO3/SrTiO3 heterostructures


Basletić, Mario; Maurice, Jean-Luc; Carrétéro, C.; Herranz, Gervasi; Copie, Olivier; Bibes, Manuel; Jacquet, Éric; Bouzehouane, Karim; Fusil, Stephen; Barthélémy, Agnes
Mapping the spatial distribution of charge carriers in LaAlO3/SrTiO3 heterostructures // Nature Materials, 7 (2008), 8; 621-625 doi:10.1038/nmat2223 (međunarodna recenzija, članak, znanstveni)


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Naslov
Mapping the spatial distribution of charge carriers in LaAlO3/SrTiO3 heterostructures

Autori
Basletić, Mario ; Maurice, Jean-Luc ; Carrétéro, C. ; Herranz, Gervasi ; Copie, Olivier ; Bibes, Manuel ; Jacquet, Éric ; Bouzehouane, Karim ; Fusil, Stephen ; Barthélémy, Agnes

Izvornik
Nature Materials (1476-1122) 7 (2008), 8; 621-625

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
electronic transport in interface structures; diffusion of impurities; conducting-tip atomic force microscopy; pulsed laser depostition

Sažetak
At the interface between complex insulating oxides, novel phases with interesting properties may occur, such as the metallic state reported in the LaAlO3/SrTiO3 system. Although this state has been predicted and reported to be confined at the interface, some studies indicate a much broader spatial extension, thereby questioning its origin. Here, we provide for the first time a direct determination of the carrier density profile of this system through resistance profile mappings collected in cross-section LaAlO3/SrTiO3 samples with a conducting-tip atomic force microscope (CT-AFM). We find that, depending on specific growth protocols, the spatial extension of the high-mobility electron gas can be varied from hundreds of micrometres into SrTiO3 to a few nanometres next to the LaAlO3/SrTiO3 interface. Our results emphasize the potential of CT-AFM as a novel tool to characterize complex oxide interfaces and provide us with a definitive and conclusive way to reconcile the body of experimental data in this system.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Projekti:
119-1191458-1023 - Sustavi s prostornim i dimenzijskim ograničenjima: korelacije i spinski efekti (Hamzić, Amir, MZOS ) ( POIROT)

Ustanove:
Prirodoslovno-matematički fakultet, Zagreb

Profili:

Avatar Url Mario Basletić (autor)

doi

Citiraj ovu publikaciju

Basletić, Mario; Maurice, Jean-Luc; Carrétéro, C.; Herranz, Gervasi; Copie, Olivier; Bibes, Manuel; Jacquet, Éric; Bouzehouane, Karim; Fusil, Stephen; Barthélémy, Agnes
Mapping the spatial distribution of charge carriers in LaAlO3/SrTiO3 heterostructures // Nature Materials, 7 (2008), 8; 621-625 doi:10.1038/nmat2223 (međunarodna recenzija, članak, znanstveni)
Basletić, M., Maurice, J., Carrétéro, C., Herranz, G., Copie, O., Bibes, M., Jacquet, É., Bouzehouane, K., Fusil, S. & Barthélémy, A. (2008) Mapping the spatial distribution of charge carriers in LaAlO3/SrTiO3 heterostructures. Nature Materials, 7 (8), 621-625 doi:10.1038/nmat2223.
@article{article, year = {2008}, pages = {621-625}, DOI = {10.1038/nmat2223}, keywords = {electronic transport in interface structures, diffusion of impurities, conducting-tip atomic force microscopy, pulsed laser depostition}, journal = {Nature Materials}, doi = {10.1038/nmat2223}, volume = {7}, number = {8}, issn = {1476-1122}, title = {Mapping the spatial distribution of charge carriers in LaAlO3/SrTiO3 heterostructures}, keyword = {electronic transport in interface structures, diffusion of impurities, conducting-tip atomic force microscopy, pulsed laser depostition} }
@article{article, year = {2008}, pages = {621-625}, DOI = {10.1038/nmat2223}, keywords = {electronic transport in interface structures, diffusion of impurities, conducting-tip atomic force microscopy, pulsed laser depostition}, journal = {Nature Materials}, doi = {10.1038/nmat2223}, volume = {7}, number = {8}, issn = {1476-1122}, title = {Mapping the spatial distribution of charge carriers in LaAlO3/SrTiO3 heterostructures}, keyword = {electronic transport in interface structures, diffusion of impurities, conducting-tip atomic force microscopy, pulsed laser depostition} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus
  • MEDLINE


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