A Study of 2D GISAXS Patterns of Nanostructured Cerium/Vanadium Oxide Thin Films (CROSBI ID 537497)
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Podaci o odgovornosti
Lučić-Lavčević, Magdy ; Dubček, Pavo ; Šreder, Aljoška ; Turković, Aleksandra ; Orel, Bojan ; Crnjak Orel, Zorica ; Bernstorff, Sigrid
engleski
A Study of 2D GISAXS Patterns of Nanostructured Cerium/Vanadium Oxide Thin Films
Cerium/vanadium mixed oxide films, designed for application in electrochemical cells and electrochemical devices, were obtained on glass substrates by the sol-gel process. An analysis of structural modification of these films, induced by ultrasonification, annealing and by introduction of lithium ions, was performed, using grazing incidence X-ray scattering (GISAXS) technique. Two-dimensional GISAXS spectra were measured at different grazing angles, starting from slightly below the critical angle. One-dimensional scattering curves were extracted from these spectra, showing the dependence of the scattering intensity on different components of the wave vector in the scattering plane. These extractions - "cuts" in differnt directions enable a specific film depth nanostructural profiling.
GISAXS; cerium/vanadium oxide films
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Podaci o prilogu
88-x.
2007.
objavljeno
Podaci o matičnoj publikaciji
17th International vacuum Congress, Stockholm, Sweden
Podaci o skupu
17th International Vacuum Congress
poster
02.06.2007-02.06.2007
Stockholm, Švedska