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Compositional variation of optical and refractometric parameters of Hf1-xTixO2 thin films

Experimental ellipsometric studies of Hf1-xTixO2 thin films were carried out to determine refractive index as well as spectrometric studies of these films were carried out to determine interferential transmision spectra. The dispersion curves of the refractive indices are well described by the optical-refractometric relation. Compositional dependences of optical pseudogap and refractive indices of Hf1-xTixO2 thin films are investigated. Effect of compositional disordering on the optical absorption edge in Hf1-xTixO2 thin films is studied.

thin films; amorphous materials; oxides; optical properties

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