Dependence of Deep Trap Recombination Coefficients on Temperature (CROSBI ID 463728)
Prilog sa skupa u zborniku | izvorni znanstveni rad | međunarodna recenzija
Podaci o odgovornosti
Divković-Pukšec, Julijana
engleski
Dependence of Deep Trap Recombination Coefficients on Temperature
Measurements of the lifetime in the dependence of the current and of the temperature give us much interesting information. One of them is the temperature dependence of the capture coefficients. Measurements were made on a p^+pnn^+ structure into which various deep traps were added. The deep energy levels, associated with the traps lie over or under Fermi level. Those various positions are the cause of different behavior of lifetime with the injection level. For all observed cases the capture coefficients show strong dependence on temperature; as temperature raises the capture coefficients becomes smaller.
recombination; lifetime; deep traps; capture coefficients
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Podaci o prilogu
1-4-x.
1997.
objavljeno
Podaci o matičnoj publikaciji
Biljanović, Petar ; Skala, Karolj ; Ribarić, Slobodan ; Budin, Leo
Rijeka: Hrvatska udruga za informacijsku i komunikacijsku tehnologiju, elektroniku i mikroelektroniku - MIPRO
Podaci o skupu
MIPRO'97 - 20th International Convention
predavanje
19.05.1997-23.05.1997
Opatija, Hrvatska