Napredna pretraga

Pregled bibliografske jedinice broj: 320268

Spectroscopic study of SiC-like structures formed on polycrystalline silicon sheets during growth


Pivac, Branko; Furić, Krešimir; Milun, Milorad; Valla, Tonica; Borghesi, Alessandro; Sassella, Adele
Spectroscopic study of SiC-like structures formed on polycrystalline silicon sheets during growth // Journal of Applied Physics, 75 (1994), 7; 3586-3592 (međunarodna recenzija, članak, znanstveni)


Naslov
Spectroscopic study of SiC-like structures formed on polycrystalline silicon sheets during growth

Autori
Pivac, Branko ; Furić, Krešimir ; Milun, Milorad ; Valla, Tonica ; Borghesi, Alessandro ; Sassella, Adele

Izvornik
Journal of Applied Physics (0021-8979) 75 (1994), 7; 3586-3592

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
Silicon carbide films; crystallinity; x-ray photoelectron spectroscopy; Raman spectroscopy

Sažetak
Edge-defined film-fed grown polycrystalline silicon sheets, grown with one face exposed to oxidizing CO gas added to the inert Ar atmosphere, were studied. Interaction of CO with molten silicon surface during growth produced SiC-like structures in a thin layer on the surface exposed to CO. Infrared spectroscopy results suggest that this layer is constituted of good quality SiC ; however, Raman and x-ray photoelectron spectroscopy showed that it consists of Si1− xCx in the form of small crystallites mixed with C- and O-rich silicon. Journal of Applied Physics is copyrighted by The American Institute of Physics.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Projekt / tema
1-03-066
1-03-178

Ustanove
Institut za fiziku, Zagreb,
Institut "Ruđer Bošković", Zagreb

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus


Uključenost u ostale bibliografske baze podataka:


  • Chemical Abstracts
  • The INSPEC Science Abstracts series