Nalazite se na CroRIS probnoj okolini. Ovdje evidentirani podaci neće biti pohranjeni u Informacijskom sustavu znanosti RH. Ako je ovo greška, CroRIS produkcijskoj okolini moguće je pristupi putem poveznice www.croris.hr
izvor podataka: crosbi

GISAXS study of cadmium sulfide quantum dots (CROSBI ID 135931)

Prilog u časopisu | izvorni znanstveni rad | međunarodna recenzija

Dubček, Pavo ; Bernstorff, Sigrid ; Desnica, Uroš ; Desnica-Franković, Ida Dunja ; Salamon, Krešimir GISAXS study of cadmium sulfide quantum dots // Surface review and letters, 9 (2002), 1; 455-459-x

Podaci o odgovornosti

Dubček, Pavo ; Bernstorff, Sigrid ; Desnica, Uroš ; Desnica-Franković, Ida Dunja ; Salamon, Krešimir

engleski

GISAXS study of cadmium sulfide quantum dots

In order to investigate the structure of semiconductor/glass composites prepared by ion implantation, the grazing incidence small angle X-ray scattering (GISAXS) technique was applied to CdS nanocrystals synthesized in SiO2 by implanting separately the constituent Cd and S atoms with a dose of 10(17)/cm(2) each, which resulted in a Gaussian depth density distribution of the dopants. Subsequently the samples were annealed at 700degreesC in order to form CdS particles. Due to the high concentration of nanocrystalline CdS, the scattered intensity is not following simple homogenous film models. Instead, additional particle scattering contribution is detected, as well as a multiplicative contribution due to inplane (lateral) particle correlation. From the first one, the particle size is estimated to be 4.6 nm, while an interparticle distance of 15-25 nm is deduced from the latter. Taking into account the applied dose, these values suggest that either part of the Cd and S ions are still dissolved in the amorphous substrate after annealing, and thus are not contributing to the CdS nanoparticle formation, or that implanted atoms have diffused deeper into the substrate during annealing.

X-rays; nanocrystals; implantation; scattering; interfaces; neutrons

nije evidentirano

nije evidentirano

nije evidentirano

nije evidentirano

nije evidentirano

nije evidentirano

Podaci o izdanju

9 (1)

2002.

455-459-x

objavljeno

0218-625X

Povezanost rada

Fizika

Indeksiranost