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CdTe Hole Lifetime from the Gamma-Ray and Photo-Induced Effects (CROSBI ID 135874)

Prilog u časopisu | izvorni znanstveni rad

Desnica, Uroš ; Urli, Natko CdTe Hole Lifetime from the Gamma-Ray and Photo-Induced Effects // Fizika (Zagreb), 3 (1972), 259-269-x

Podaci o odgovornosti

Desnica, Uroš ; Urli, Natko

engleski

CdTe Hole Lifetime from the Gamma-Ray and Photo-Induced Effects

Two independent methods, the gamma-rays induced photovoltaic effect and the monocromatic light induced photoeffect, were used for determinantion of the minority carriers lifetime in p-type CdTe. The exsisting expressions for collection efficiency of electron-hole pairs generated by visible light near the p-n junction were extended to include the contribution from the depleted layer.... The values of lifetime of holes in CdTe obtained by two methods were in agreement, within the limits of experimental error.

CdTe; Hole Lifetime; Gamma-Rays; Photo-Induced Effect

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Podaci o izdanju

3

1972.

259-269-x

objavljeno

0015-3206

Povezanost rada

Fizika