izvor podataka: crosbi
✓
TSCAP and Admittance Spectroscopy of Defects Induced by Gamma-Rays in GaP (CROSBI ID 135872)
Prilog u časopisu | izvorni znanstveni rad
Desnica, Uroš ; Etlinger, Božidar ; Urli, Natko
TSCAP and Admittance Spectroscopy of Defects Induced by Gamma-Rays in GaP // Institute of physics conference series, 25 (1973), 341-346-x
Podaci o odgovornosti
Desnica, Uroš ; Etlinger, Božidar ; Urli, Natko
engleski
TSCAP and Admittance Spectroscopy of Defects Induced by Gamma-Rays in GaP
Radiation damage has been introduced into GaP diodes by Co gamma irradiation at 300 K.
TSCAP; admitance spectroscopy; defects; GaP
nije evidentirano
nije evidentirano
nije evidentirano
nije evidentirano
nije evidentirano
nije evidentirano
Podaci o izdanju
Povezanost rada
Povezane osobe
Povezane ustanove
