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Pregled bibliografske jedinice broj: 316731

Grazing incidence small-angle X-ray scattering studies of the synthesis and growth of CdS quantum dots from constituent atoms in SiO2 matrix


Desnica, Uroš; Dubček, Pavo; Desnica-Franković, Dunja; Buljan, Maja; Bernstorff, Sigrid; White, C. W.
Grazing incidence small-angle X-ray scattering studies of the synthesis and growth of CdS quantum dots from constituent atoms in SiO2 matrix // Journal of Applied Crystallography, 36 (2003), Part 3 Special Issue 1; 443-446 (međunarodna recenzija, članak, znanstveni)


Naslov
Grazing incidence small-angle X-ray scattering studies of the synthesis and growth of CdS quantum dots from constituent atoms in SiO2 matrix

Autori
Desnica, Uroš ; Dubček, Pavo ; Desnica-Franković, Dunja ; Buljan, Maja ; Bernstorff, Sigrid ; White, C. W.

Izvornik
Journal of Applied Crystallography (0021-8898) 36 (2003), Part 3 Special Issue 1; 443-446

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
Nanocrystals; quantum dots; X-ray scattering; SAXS; GISAXS; implantation; CdS

Sažetak
Grazing incidence small angle X-ray scattering was applied to study the synthesis and growth of CdS quantum dots (QDs) from Cd and S atoms implanted in SiO2. For a dose of 1017/cm2, the partial synthesis of CdS QDs occurred already during implantation, with only moderate size increase upon subsequent annealing up to Ta=1073 K. The dynamics of QD synthesis and growth were considerably different already for two times lower dose, where synthesis started only after annealing at Ta = 773 K, with a strong increase of the size of QDs upon annealing at higher Ta. Results suggest that high-dose implantation followed by low-T annealing could lead to better defined sizes and narrower size distributions of QDs.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Projekt / tema
0098020

Ustanove
Institut "Ruđer Bošković", Zagreb

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus


Uključenost u ostale bibliografske baze podataka:


  • The INSPEC Science Abstracts series