Nalazite se na CroRIS probnoj okolini. Ovdje evidentirani podaci neće biti pohranjeni u Informacijskom sustavu znanosti RH. Ako je ovo greška, CroRIS produkcijskoj okolini moguće je pristupi putem poveznice www.croris.hr
izvor podataka: crosbi

Raman Technique in Determination of Size Distribution of Oxide and Semiconductor Nanoparticles (CROSBI ID 135157)

Prilog u časopisu | izvorni znanstveni rad

Ivanda, Mile ; Furić, Krešimir ; Musić, Svetozar ; Gotić, Marijan ; Ristić, Mira ; Turković, Aleksandra ; Tonejc, Anđelka M. ; Djerdj, Igor ; Crnjak Orel, Zorica ; Montagna, M. et al. Raman Technique in Determination of Size Distribution of Oxide and Semiconductor Nanoparticles // Guang sanshe xuebao / Chinese Journal of Light Scattering, 17 (2005), 3; 245-248

Podaci o odgovornosti

Ivanda, Mile ; Furić, Krešimir ; Musić, Svetozar ; Gotić, Marijan ; Ristić, Mira ; Turković, Aleksandra ; Tonejc, Anđelka M. ; Djerdj, Igor ; Crnjak Orel, Zorica ; Montagna, M. ; Ferrari, M. ; Schmitt, M. ; Babocsi, K. ; Kiefer W.

engleski

Raman Technique in Determination of Size Distribution of Oxide and Semiconductor Nanoparticles

This contribution reports on application of low-wavenumber Raman scattering on acoustical vibrational modes of nanoparticles. Theoretical background as well as the experimental results in determination of oxide and semiconductor particle size distribution will be presented.

Raman; Spectroscopy; Nanoparticles

nije evidentirano

nije evidentirano

nije evidentirano

nije evidentirano

nije evidentirano

nije evidentirano

Podaci o izdanju

17 (3)

2005.

245-248

objavljeno

1004-5929

Povezanost rada

Fizika