engleski

A study of 2D GISAXS Patterns of Nanostructured Cerium/vanadium Oxide Thin Films

Nanostructural characteristics of vanadium/cerium mixed oxide film, prepared by sol-gel process, deposited by dip-coating and intercalated by lithium ions were studied by grazing-incidence small-angle X-ray scattering. In this technique, the penetration of X-rays in the sample is controlled by choosing the angle of incidence, so the scattering signal of different film levels was recorded, from the surface to the substrate of the film. The film was considered as an aggregate, containing nanosized particles and pores. The size distributions of particles were calculated for several film levels, so that the nanostructure of the film depth-profile could be determined. As two-dimensional recording of the scattering signal was applied, the comparison of surface and bulk scattering contribution was also valuable in determining the corresponding film characteristics. Although lithium intercalation does not change the general characteristics of the film profile, its influence on the size distributions of particles as well as on the film surface characteristics was observed.

GISAXS; V/Ce oxides

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