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Comparison of 1D and 2D model of quantum effects in the simulation of sub-50 nm double-gate MOSFETs (CROSBI ID 529614)

Prilog sa skupa u zborniku | izvorni znanstveni rad | međunarodna recenzija

Poljak, Mirko ; Biljanović, Petar ; Suligoj, Tomislav Comparison of 1D and 2D model of quantum effects in the simulation of sub-50 nm double-gate MOSFETs // Proceedings of the 30th International Convention MIPRO 2007 / P. Biljanović, K. Skala (ur.). Rijeka, 2007. str. 78-83-x

Podaci o odgovornosti

Poljak, Mirko ; Biljanović, Petar ; Suligoj, Tomislav

engleski

Comparison of 1D and 2D model of quantum effects in the simulation of sub-50 nm double-gate MOSFETs

Quantum-mechanical phenomena in sub-50 nanometer double-gate MOSFETs are theoretically considered by a wavefunction approach and Non-Equilibrium Green's Function (NEGF) model was used in the simulations. Simulation results indicate that the classical models are not adequate for the realistic optimization of double-gate MOSFETs. Lateral quantum effects decrease the on-state current by up to 9, 4% in sub-50 nm devices so at least a 2D quantum mechanical simulation is needed in order to predict double-gate transistors characteristics in sub-50 nanometer region.

quantum effects; 2D model; double-gate; MOSFET

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Podaci o prilogu

78-83-x.

2007.

objavljeno

Podaci o matičnoj publikaciji

P. Biljanović, K. Skala

Rijeka:

Podaci o skupu

International Convention MIPRO

predavanje

21.05.2007-25.05.2007

Opatija, Hrvatska

Povezanost rada

Elektrotehnika