engleski

Determination of refractive index of a-Si1-xCx:H thin films from infrared absorption spectra

The index of refractiion of A-Si1-xCx:H thin films obtained by magnetron sputtering was determined by means of IR absorption measurements. Structural and compositional changes that take place by increasing x make the film a mixture of different species, giving an effective value of the refractive index.

amorphous silicon carbide ; effective index of refraction ; optical properties ; IR absorption measurements

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