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Pregled bibliografske jedinice broj: 303516

Determination of refractive index of a-Si1-xCx:H thin films from infrared absorption spectra


Lugomer, Stjepan; Maksimović, Aleksandar; Gracin, Davor
Determination of refractive index of a-Si1-xCx:H thin films from infrared absorption spectra // Applied optics, 32 (1993), 7; 1173-1175 doi:10.1364/AO.32.001173 (međunarodna recenzija, članak, znanstveni)


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Naslov
Determination of refractive index of a-Si1-xCx:H thin films from infrared absorption spectra

Autori
Lugomer, Stjepan ; Maksimović, Aleksandar ; Gracin, Davor

Izvornik
Applied optics (0003-6935) 32 (1993), 7; 1173-1175

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
amorphous silicon carbide; effective index of refraction; optical properties; IR absorption measurements

Sažetak
The index of refractiion of A-Si1-xCx:H thin films obtained by magnetron sputtering was determined by means of IR absorption measurements. Structural and compositional changes that take place by increasing x make the film a mixture of different species, giving an effective value of the refractive index.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Ustanove:
Institut "Ruđer Bošković", Zagreb

Citiraj ovu publikaciju

Lugomer, Stjepan; Maksimović, Aleksandar; Gracin, Davor
Determination of refractive index of a-Si1-xCx:H thin films from infrared absorption spectra // Applied optics, 32 (1993), 7; 1173-1175 doi:10.1364/AO.32.001173 (međunarodna recenzija, članak, znanstveni)
Lugomer, S., Maksimović, A. & Gracin, D. (1993) Determination of refractive index of a-Si1-xCx:H thin films from infrared absorption spectra. Applied optics, 32 (7), 1173-1175 doi:10.1364/AO.32.001173.
@article{article, year = {1993}, pages = {1173-1175}, DOI = {10.1364/AO.32.001173}, keywords = {amorphous silicon carbide, effective index of refraction, optical properties, IR absorption measurements}, journal = {Applied optics}, doi = {10.1364/AO.32.001173}, volume = {32}, number = {7}, issn = {0003-6935}, title = {Determination of refractive index of a-Si1-xCx:H thin films from infrared absorption spectra}, keyword = {amorphous silicon carbide, effective index of refraction, optical properties, IR absorption measurements} }
@article{article, year = {1993}, pages = {1173-1175}, DOI = {10.1364/AO.32.001173}, keywords = {amorphous silicon carbide, effective index of refraction, optical properties, IR absorption measurements}, journal = {Applied optics}, doi = {10.1364/AO.32.001173}, volume = {32}, number = {7}, issn = {0003-6935}, title = {Determination of refractive index of a-Si1-xCx:H thin films from infrared absorption spectra}, keyword = {amorphous silicon carbide, effective index of refraction, optical properties, IR absorption measurements} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • SCI-EXP, SSCI i/ili A&HCI


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