Nalazite se na CroRIS probnoj okolini. Ovdje evidentirani podaci neće biti pohranjeni u Informacijskom sustavu znanosti RH. Ako je ovo greška, CroRIS produkcijskoj okolini moguće je pristupi putem poveznice www.croris.hr
izvor podataka: crosbi

IR and Raman study of Si_(1-x)C_x:H amorphous thin films (CROSBI ID 132390)

Prilog u časopisu | izvorni znanstveni rad | međunarodna recenzija

Lugomer, Stjepan ; Ivanda, Mile ; Gracin, Davor ; Furić, Krešimir ; Maksimović, Aleksandar IR and Raman study of Si_(1-x)C_x:H amorphous thin films // Journal of molecular structure, 267 (1992), 347-351

Podaci o odgovornosti

Lugomer, Stjepan ; Ivanda, Mile ; Gracin, Davor ; Furić, Krešimir ; Maksimović, Aleksandar

engleski

IR and Raman study of Si_(1-x)C_x:H amorphous thin films

Amorphous hydrogenated a-Si_(1-x)C_x:H thin films have been obtained by means of DC magnetron sputtering in the benzene vapour. Comparative IR and Raman spectroscopy study of carbon incorporation in the silicon matrix have been performed. It was found that carbon incorporates in the form of the CH_3-groups, individual C-atoms and the C_6H_6 molecules.

infrared specroscopy ; Raman ; amorphous silicon carbide

nije evidentirano

nije evidentirano

nije evidentirano

nije evidentirano

nije evidentirano

nije evidentirano

Podaci o izdanju

267

1992.

347-351

objavljeno

0022-2860

1872-8014

Povezanost rada

Fizika

Indeksiranost