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Pregled bibliografske jedinice broj: 299338

Diffusion during annealing of Al/Cu/Fe thin films


Čekada, Miha; Panjan, Peter; Dolinšek, Janez; Zalar, Anton; Medunić, Zvonko; Jakšić, Milko; Radić, Nikola
Diffusion during annealing of Al/Cu/Fe thin films // Thin Solid Films, 515 (2007), 18; 7135-7139 (međunarodna recenzija, članak, znanstveni)


Naslov
Diffusion during annealing of Al/Cu/Fe thin films

Autori
Čekada, Miha ; Panjan, Peter ; Dolinšek, Janez ; Zalar, Anton ; Medunić, Zvonko ; Jakšić, Milko ; Radić, Nikola

Izvornik
Thin Solid Films (0040-6090) 515 (2007), 18; 7135-7139

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
Diffusion; Rutherford backscattering spectroscopy; Auger electron spectroscopy; Al-Cu-Fe

Sažetak
The Al-Cu-Fe system is interesting due to the existence of the quasicrystalline phase Al62.5Cu25Fe12.5 as well as its approximant phases. A two-step procedure of thin film preparation is considered: deposition of a multilayer structure of individual elements and consequential annealing. To analyze the diffusion processes trilayers of individual elements were deposited by sputtering with a total thickness of about 400 nm. Afterwards, the samples were annealed in tube furnace in inert atmosphere. Rutherford backscattering spectrometry, Auger electron spectrometry and X-ray diffraction were used to quantify the depth profiles. The results point out to a three-stage process as a function of rising temperature: first Al and Cu form the γ -Al4Cu9 compound layer ; second the aluminium spreads throughout the film with copper and iron mainly divided. The β -Al(Cu, Fe) phase is observed. Complete homogenization is followed afterwards.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Projekt / tema
098-0982886-2895 - Novi amorfni i nanostrukturirani tankoslojni materijali (Nikola Radić, )
098-1191005-2876 - Procesi interakcije ionskih snopova i nanostrukture (Milko Jakšić, )

Ustanove
Institut "Ruđer Bošković", Zagreb

Citiraj ovu publikaciju

Čekada, Miha; Panjan, Peter; Dolinšek, Janez; Zalar, Anton; Medunić, Zvonko; Jakšić, Milko; Radić, Nikola
Diffusion during annealing of Al/Cu/Fe thin films // Thin Solid Films, 515 (2007), 18; 7135-7139 (međunarodna recenzija, članak, znanstveni)
Čekada, M., Panjan, P., Dolinšek, J., Zalar, A., Medunić, Z., Jakšić, M. & Radić, N. (2007) Diffusion during annealing of Al/Cu/Fe thin films. Thin Solid Films, 515 (18), 7135-7139.
@article{article, year = {2007}, pages = {7135-7139}, keywords = {diffusion, Rutherford backscattering spectroscopy, Auger electron spectroscopy, Al-Cu-Fe}, journal = {Thin Solid Films}, volume = {515}, number = {18}, issn = {0040-6090}, title = {Diffusion during annealing of Al/Cu/Fe thin films}, keyword = {diffusion, Rutherford backscattering spectroscopy, Auger electron spectroscopy, Al-Cu-Fe} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus


Uključenost u ostale bibliografske baze podataka:


  • The INSPEC Science Abstracts series