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Determination of grain sizes and porosity in nanophase vanadium oxide and V/Ce oxides via GISAX, GIWXD and GIXR techniques

The present study shows that the application of the particle scattering model in analyzing GISAXS measurements data can be utilized for estimating the structural properties of the vanadium/cerium oxide thin films as well as for following their structural modifications in the process of lithium intercalation. However, since SAXS analysis is model-dependent and suffers from the influence of various material properties, a two dimensional detection of the scattering signal is applied and the results are compared to those of the AFM surface imaging. In conclusion, the observed aspects of the GISAXS intensity maps supported by the AFM analysis provide a contribution to the modeling of nanostructured intercalation electrodes.

vanadium oxide; GISAX; GIWXD and GIXR techniques

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