Study of temperature evolution in nanostructured CeVO4 films via GISAXS techniques (CROSBI ID 525890)
Prilog sa skupa u zborniku | sažetak izlaganja sa skupa | međunarodna recenzija
Podaci o odgovornosti
Turković, Aleksandra ; Dubček, Pavo ; Pavlović, Mladen ; Lučić-Lavčević, Magdy, Crnjak Orel, Zorica ; Bernstorff, Sigrid
engleski
Study of temperature evolution in nanostructured CeVO4 films via GISAXS techniques
Cerium vanadate films on glass substrate were obtained by sol-gel process. The morphology of these nanostructured and porous films was studied by grazing-incidence small-angle X-ray scattering (GISAXS) at synchrotron ELETTRA, Trieste. The aim of the GISAXS study was to investigate the changes in grain sizes due to the temperature evolution with three different time intervals (5min., 15 min. and 30 min.) of annealing at 673 K. We found that the effects of the different times of annealing are diverse for surface and bulk properties of this V/Ce oxide.
CeVO4 nanostructured films; GISAXS
nije evidentirano
nije evidentirano
nije evidentirano
nije evidentirano
nije evidentirano
nije evidentirano
Podaci o prilogu
15-x.
2006.
objavljeno
Podaci o matičnoj publikaciji
Anniversary Symposium, 10 Years Austrian SAXS Station at ELETTRA, " SAXS on Nanosystems- Science and Technology"
Laggner, Peter
Graz: Austrian Academy of Science
Podaci o skupu
Anniversary Symposium, 10 Years Austrian SAXS Station at ELETTRA "SAXS on Nanosystems- Science and Technology"
poster
23.11.2006-24.11.2006
Trst, Italija