izvor podataka: crosbi
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GISAXS Study of Si Nanoclusters in SiO/SiO2 Layers (CROSBI ID 523199)
Prilog sa skupa u zborniku | sažetak izlaganja sa skupa | međunarodna recenzija
Pivac, Branko ; Kovačević, Ivana ; Dubček, Pavo ; radić, Nikola ; Bernstorff, Sigrid
GISAXS Study of Si Nanoclusters in SiO/SiO2 Layers // JVC11 Joint Vacuum Conference - Programme and Book of Abstracts / Mašek, Karel (ur.). Prag: Czech Vacuum Society, 2006. str. 79-79-x
Podaci o odgovornosti
Pivac, Branko ; Kovačević, Ivana ; Dubček, Pavo ; radić, Nikola ; Bernstorff, Sigrid
engleski
GISAXS Study of Si Nanoclusters in SiO/SiO2 Layers
We present a study on amorphous SiO/SiO2 superlattice using grazing-incidence small-angle X-ray scattering (GISAXS).
GISAXS; nanoclusters; silicon
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Podaci o prilogu
79-79-x.
2006.
objavljeno
Podaci o matičnoj publikaciji
JVC11 Joint Vacuum Conference - Programme and Book of Abstracts
Mašek, Karel
Prag: Czech Vacuum Society
Podaci o skupu
JVC11 - 11th Joint Vacuum Conference
poster
24.09.2006-28.09.2006
Prag, Češka Republika
