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Pregled bibliografske jedinice broj: 273577

Structure and optical properties of porous silicon prepared on thin epitaxial silocon layer on silicon substrates


Balarin, Maja; Gamulin, Ozren; Ivanda, Mile; Musić, Svetozar; Furić, Krešimir
Structure and optical properties of porous silicon prepared on thin epitaxial silocon layer on silicon substrates // EUCMOSXXVIII - Istanbul 2006 / Akyuz, Sevim ; Akalin, Elif (ur.).
Istanbul: Istanbul University, 2006. (poster, međunarodna recenzija, sažetak, znanstveni)


Naslov
Structure and optical properties of porous silicon prepared on thin epitaxial silocon layer on silicon substrates

Autori
Balarin, Maja ; Gamulin, Ozren ; Ivanda, Mile ; Musić, Svetozar ; Furić, Krešimir

Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, znanstveni

Izvornik
EUCMOSXXVIII - Istanbul 2006 / Akyuz, Sevim ; Akalin, Elif - Istanbul : Istanbul University, 2006

Skup
XXVIII European Congress on Molecular Spectroscopy

Mjesto i datum
Istanbul, Turska, 3. - 8. 09. 2006

Vrsta sudjelovanja
Poster

Vrsta recenzije
Međunarodna recenzija

Ključne riječi
Porous silicon; Silicon on insulator; Raman and infrared spectroscopy; SEM

Sažetak
The porous silicon samples were prepared by electrochemical etching1 of 10 micrometer tick p-type (111) silicon epitaxial layer grown on a thin 80 nm SiO_2 layer on silicon substrates, by varying the concentration of 48% HF in ethanol solution. Within the epitaxial layer micro- and nano-pores of different sizes in dependence on HF concentration were obtained. The structural and optical properties of prepared samples were investigated by Raman and infrared spectroscopy and scanning electron microscopy (SEM).

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Projekt / tema
0098022
0098062
0108043

Ustanove
Institut "Ruđer Bošković", Zagreb,
Medicinski fakultet, Zagreb