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SAXS Study of the Interface Between Grains and Pores in CeO2 Thin Films

Thin films of CeO2, prepared by different sol-gel procedures, were examined by small angle X-ray scattering (SAXS). It was presumed that the structure of sol-gel derived CeO2 films can be analyzed by SAXS, because these films can be considered as two-phase systems, i.e. they contain nanosized grains (as one phase) and pores (as another). So, the inner surface of such a film is actually the interface between the two phases. The SAXS analysis, i.e. the analysis of the scattering depletion at small angles, can give information about the existence and the thickness of an interfacial layer. Consequently, it serves as a test whether the preparation procedure gives the desirable structure parameters regarding the applicability of films as nanostructured electrodes. The experiment was performed using the SAXS beamline at the ELETTRA synchrotron in Trieste .

SAXS; CeO2 nanostructured films

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