Pretražite po imenu i prezimenu autora, mentora, urednika, prevoditelja

Napredna pretraga

Pregled bibliografske jedinice broj: 256705

Growth of Ge islands on Si substrates


Radić, Nikola; Pivac, Branko; Dubček, Pavo; Kovačević, Ivana; Bernstorff, Sigrid;
Growth of Ge islands on Si substrates // Thin Solid Films, 515 (2006), 2; 752-755 (međunarodna recenzija, članak, znanstveni)


CROSBI ID: 256705 Za ispravke kontaktirajte CROSBI podršku putem web obrasca

Naslov
Growth of Ge islands on Si substrates

Autori
Radić, Nikola ; Pivac, Branko ; Dubček, Pavo ; Kovačević, Ivana ; Bernstorff, Sigrid ;

Izvornik
Thin Solid Films (0040-6090) 515 (2006), 2; 752-755

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
Ge nanostructures; small angle X-ray scattering; atomic force microscopy

Sažetak
We present a study of Ge islands formation on Si(100) substrates using grazing-incidence small-angle X-ray scattering (GISAXS) and atomic force microscopy. Samples were prepared by magnetron sputtering of a 5 nm thick Ge layer in a very high-vacuum on Si(100) substrate held at different temperatures. The vertical cut (perpendicular to the surface) of the experimental 2D GISAXS pattern has been fitted using a Guinier approximation. The optimum temperature for the islands formation was 650°C. At this temperature islands grow in conical shape with very similar dimensions, however, inter-island distances varied significantly.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Projekti:
0098021
0098020

Ustanove:
Institut "Ruđer Bošković", Zagreb

Profili:

Avatar Url Nikola Radić (autor)

Avatar Url Branko Pivac (autor)

Avatar Url Ivana Capan (autor)

Avatar Url Pavo Dubček (autor)

Citiraj ovu publikaciju

Radić, Nikola; Pivac, Branko; Dubček, Pavo; Kovačević, Ivana; Bernstorff, Sigrid;
Growth of Ge islands on Si substrates // Thin Solid Films, 515 (2006), 2; 752-755 (međunarodna recenzija, članak, znanstveni)
Radić, N., Pivac, B., Dubček, P., Kovačević, I., Bernstorff, S. & (2006) Growth of Ge islands on Si substrates. Thin Solid Films, 515 (2), 752-755.
@article{article, year = {2006}, pages = {752-755}, keywords = {Ge nanostructures, small angle X-ray scattering, atomic force microscopy}, journal = {Thin Solid Films}, volume = {515}, number = {2}, issn = {0040-6090}, title = {Growth of Ge islands on Si substrates}, keyword = {Ge nanostructures, small angle X-ray scattering, atomic force microscopy} }
@article{article, year = {2006}, pages = {752-755}, keywords = {Ge nanostructures, small angle X-ray scattering, atomic force microscopy}, journal = {Thin Solid Films}, volume = {515}, number = {2}, issn = {0040-6090}, title = {Growth of Ge islands on Si substrates}, keyword = {Ge nanostructures, small angle X-ray scattering, atomic force microscopy} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus





Contrast
Increase Font
Decrease Font
Dyslexic Font