Pretražite po imenu i prezimenu autora, mentora, urednika, prevoditelja

Napredna pretraga

Pregled bibliografske jedinice broj: 249857

A GISAXS study of SiO/SiO2 superlattice


Kovačević, Ivana; Pivac, Branko; Dubček, Pavo; Radić, Nikola; Bernstorff, S.; Slaoui, A.
A GISAXS study of SiO/SiO2 superlattice // Thin Solid Films, 511-512 (2006), 463-467 (međunarodna recenzija, članak, znanstveni)


CROSBI ID: 249857 Za ispravke kontaktirajte CROSBI podršku putem web obrasca

Naslov
A GISAXS study of SiO/SiO2 superlattice

Autori
Kovačević, Ivana ; Pivac, Branko ; Dubček, Pavo ; Radić, Nikola ; Bernstorff, S. ; Slaoui, A.

Izvornik
Thin Solid Films (0040-6090) 511-512 (2006); 463-467

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
silicon; nanostructures; SiO/SiO2 superlattice; solar cells; grazing incidence small angle X-ray scattering

Sažetak
We present a structural analysis of Ge islands on Si(100) substrates using grazing-incidence small-angle X-ray scattering (GISAXS). GISAXS is a nondestructive and powerful technique for structural characterization of islands fabricated on a substrate. From the GISAXS pattern it is possible to determine the size, the shape, the inter-island distance and the size distribution of islands. In this work, the samples were prepared with high-vacuum evaporation of a 10nm thick Ge layer on Si(100) substrate heated at 200  C. The samples were annealed at 500 - 700 °C for 1h in vacuum, yielding to island formation. The implementation of such Ge islands into silicon solar cells is proposed.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Projekt / tema
0098021
0098020

Ustanove
Institut "Ruđer Bošković", Zagreb

Profili:

Avatar Url Ivana Capan (autor)

Avatar Url Pavo Dubček (autor)

Avatar Url Branko Pivac (autor)

Avatar Url Nikola Radić (autor)

Citiraj ovu publikaciju

Kovačević, Ivana; Pivac, Branko; Dubček, Pavo; Radić, Nikola; Bernstorff, S.; Slaoui, A.
A GISAXS study of SiO/SiO2 superlattice // Thin Solid Films, 511-512 (2006), 463-467 (međunarodna recenzija, članak, znanstveni)
Kovačević, I., Pivac, B., Dubček, P., Radić, N., Bernstorff, S. & Slaoui, A. (2006) A GISAXS study of SiO/SiO2 superlattice. Thin Solid Films, 511-512, 463-467.
@article{article, year = {2006}, pages = {463-467}, keywords = {silicon, nanostructures, SiO/SiO2 superlattice, solar cells, grazing incidence small angle X-ray scattering}, journal = {Thin Solid Films}, volume = {511-512}, issn = {0040-6090}, title = {A GISAXS study of SiO/SiO2 superlattice}, keyword = {silicon, nanostructures, SiO/SiO2 superlattice, solar cells, grazing incidence small angle X-ray scattering} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus





Contrast
Increase Font
Decrease Font
Dyslexic Font