Nalazite se na CroRIS probnoj okolini. Ovdje evidentirani podaci neće biti pohranjeni u Informacijskom sustavu znanosti RH. Ako je ovo greška, CroRIS produkcijskoj okolini moguće je pristupi putem poveznice www.croris.hr
izvor podataka: crosbi

X-Ray Tomographic Microscopy at SLS: present status and future developments (CROSBI ID 516793)

Prilog sa skupa u zborniku | sažetak izlaganja sa skupa

Stampanoni, Marco ; Groso, Amela ; Abela, Rafael ; Lange, Michael ; Zelenika, Saša ; et al. X-Ray Tomographic Microscopy at SLS: present status and future developments // 5th SLS Users' Meeting. Villigen: PSI, 2004. str. 57-x

Podaci o odgovornosti

Stampanoni, Marco ; Groso, Amela ; Abela, Rafael ; Lange, Michael ; Zelenika, Saša ; et al.

engleski

X-Ray Tomographic Microscopy at SLS: present status and future developments

The X-Ray Tomopgraphic Microscopy (XTM) station of the Materials Science Beamline has been routinely operated for user's experiments. During the last year several important improvements were made in the beamline diagnostics, user-frendliness, data acqusition, data pre- and post-processing, data visualization and data archiving. Here we present the most relevant ameliorations as well as the interventions planned for the immediate future. At the same time, the design of the new XTM dedicated beamline has been started and the most critical components have been either already ordered or are currently being defined. The novel beamline will be located at the X02DA port of the SLS and will receive photons from a 3.1 T superbend. The white beam will be filtered by a fixed-exit double-crystal-multilayer monochromator (DCMM) covering an energy range from 8 to 45 keV with variable bandwith. The standard SLS front-end design has been modified in order to accommodate the DCMM at a very short distance from the source, resulting in a smaller, more stable and more performing optic. An updated version of the present XTM microscope will be installed at 20 m from the source: this distance can be increased up to 30 m in order to fully exploit the coherence properties of the source. In this work the major components of the new beamline will be described.

X-ray tomographic microscopy; beamline design

nije evidentirano

nije evidentirano

nije evidentirano

nije evidentirano

nije evidentirano

nije evidentirano

Podaci o prilogu

57-x.

2004.

objavljeno

Podaci o matičnoj publikaciji

5th SLS Users' Meeting

Villigen: PSI

Podaci o skupu

5th SLS Users' Meeting

poster

04.10.2004-05.10.2004

Villigen, Švicarska

Povezanost rada

Fizika, Strojarstvo