Improvement of BVCEO vs fT Trade-off by Charge Sharing Effect (CROSBI ID 515090)
Prilog sa skupa u zborniku | izvorni znanstveni rad | međunarodna recenzija
Podaci o odgovornosti
Koričić, Marko ; Biljanović, Petar ; Suligoj, Tomislav
engleski
Improvement of BVCEO vs fT Trade-off by Charge Sharing Effect
The observed improvement of BVCEO and fTxBVCEO product of Horizontal Current Bipolar Transistor (HCBT) is explained by the collector charge sharing between the extrinsic and intrinsic base acceptors. It reduces the maximum electric field in the intrinsic transistor. A simple model is developed to physicaly explain improvement of the breakdown voltage. An optimization of HCBT structure with respect to the BVCEO and fTxBVCEO product is given by the simulation. BVCEO is increased by 23.6% while fT is reduced only by 6.3%, resulting in higher fTxBVCEO product.
charge sharing; impact ionization; breakdown voltages; cut off frequency; HCBT
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Podaci o prilogu
355-358-x.
2004.
objavljeno
Podaci o matičnoj publikaciji
CAS 2004 Proceedings
Dascalu, Dan
Bukurešt: Institute of Electrical and Electronics Engineers (IEEE)
Podaci o skupu
2004 International Semiconductor Conference
predavanje
04.10.2004-06.10.2004
Sinaia, Rumunjska