Grazing-incident small-angle X-ray scattering (GISAXS) study of SiO/SiO2 superlattice (CROSBI ID 510580)
Prilog sa skupa u zborniku | izvorni znanstveni rad | međunarodna recenzija
Podaci o odgovornosti
Pivac, Branko ; Kovačević, Ivana ; Dubček, Pavo ; Zorc, Hrvoje ; Radić, Nikola ; Bernstorff, Sigrid
engleski
Grazing-incident small-angle X-ray scattering (GISAXS) study of SiO/SiO2 superlattice
In this apper we present a study of annealing effects on amorphous SiO/SiO2 superlattice using grazing-incidence small-angle X-ray scattering (GISAXS).
SiO/SiO2; superlattice; GISAXS
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Podaci o prilogu
144-146-x.
2005.
objavljeno
Podaci o matičnoj publikaciji
Proceedings of the First International Workshop on Semiconductor Nanocrystals, SEMINANO 2005, Vol. 1
Podor, Balint ; Horvath, Zsolt J. ; Basa Peter
Budimpešta: Hungarian Academy of Sciences (MTA)
Podaci o skupu
First International Workshop on Semiconductor Nanocrystals : SEMINANO 2005
poster
10.09.2005-12.09.2005
Budimpešta, Mađarska