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A Novel Isolation of Pillar-like Structures by the Chemical-Mechanical Polishing and Etch-Back Process (CROSBI ID 115822)

Prilog u časopisu | izvorni znanstveni rad | međunarodna recenzija

Suligoj, Tomislav ; Wang, Kang L. A Novel Isolation of Pillar-like Structures by the Chemical-Mechanical Polishing and Etch-Back Process // Electrochemical and solid-state letters, 8 (2005), 5; G125-G127-x

Podaci o odgovornosti

Suligoj, Tomislav ; Wang, Kang L.

engleski

A Novel Isolation of Pillar-like Structures by the Chemical-Mechanical Polishing and Etch-Back Process

A novel isolation method of the silicon pillarlike structures, such as FinFET and lateral bipolar transistors, suitable for the future system-on-a-chip bipolar complementary metal oxide semiconductor (BiCMOS) integration is presented. The new structures are isolated by the deposition of low-temperature oxide after the pillar etching, followed by chemical mechanical polishing (CMP) and oxide etchback. A novel CMP setup is used, employing a rigid Teflon pad and the slurry composed of the gamma alumina powder diluted in deionized water with 2.5 wt % of KOH. The oxide above the 1.8 &micro ; ; m high pillars is planarized with 96% efficiency resulting in a flat, scratch-free isolation oxide surface.

FinFET; Lateral Bipolar Transistors; BiCMOS; CMP

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Podaci o izdanju

8 (5)

2005.

G125-G127-x

objavljeno

1099-0062

Povezanost rada

Elektrotehnika

Indeksiranost