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izvor podataka: crosbi

Extending the quantitative analytical capabilities of the EDXRF technique for plant-based samples (CROSBI ID 115698)

Prilog u časopisu | izvorni znanstveni rad | međunarodna recenzija

Bamford, S.A. ; Jakšić, Milko ; Medunić, Zvonko ; Wegrzynek, D. ; Chinea-Cano, E. ; Markowicz, A. Extending the quantitative analytical capabilities of the EDXRF technique for plant-based samples // X-Ray Spectrometry, 33 (2005), 4; 277-280-x

Podaci o odgovornosti

Bamford, S.A. ; Jakšić, Milko ; Medunić, Zvonko ; Wegrzynek, D. ; Chinea-Cano, E. ; Markowicz, A.

engleski

Extending the quantitative analytical capabilities of the EDXRF technique for plant-based samples

The energy-dispersive x-ray fluorescence (EDXRF) technique has limitations in the quantitative analysis of light elements (low-Z analytes with Z<10), for many reasons. This work, however, circumvents the problem through an a priori determination of low-Z analytes, representative of plant-based samples. The main purpose of this work was to characterize the major elements in the dark matrix of some plant-based samples (including biomonitors) using Rutherford backscattering spectrometry (RBS), and the results provided as a generalized input for EDXRF analysis. The derived stoichiometry and mass ratio for the moss, lichen, and cotton cellulose samples analyzed were found to be similar and Close to C7H10O5, with an average matrix of C = 49.8%, H = 4.0% and 0 = 45.8%. Quantitative analysis of plant-based reference material IAEA-336 (lichen) was subsequently carried out. Use of the a priori determined dark matrix elements (from one-time RBS spectrometry) extended the scope of applicability of the EDXRF quantitative methods used, and improved accuracy in the elemental analysis of plant-based samples. The results obtained were in good agreement with the reference values.

x-ray-fluorescence analysis; intermediate thickness samples; fundamental parameter method; radiation; elements

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Podaci o izdanju

33 (4)

2005.

277-280-x

objavljeno

0049-8246

Povezanost rada

Fizika

Indeksiranost