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Pregled bibliografske jedinice broj: 203775

Influence of stoichiometry deviations on properties of ion-beam synthesized CdSe QDs


Desnica-Franković, Ida-Dunja; Dubček, Pavo; Buljan, Maja; Furić, Krešimir; Desnica, Uroš; Bernstorff, Sigrid; Karl, Helmut; Grosshans, Ingo; Stritzker, Bern
Influence of stoichiometry deviations on properties of ion-beam synthesized CdSe QDs // Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 238 (2005), 302-305 (međunarodna recenzija, članak, znanstveni)


Naslov
Influence of stoichiometry deviations on properties of ion-beam synthesized CdSe QDs

Autori
Desnica-Franković, Ida-Dunja ; Dubček, Pavo ; Buljan, Maja ; Furić, Krešimir ; Desnica, Uroš ; Bernstorff, Sigrid ; Karl, Helmut ; Grosshans, Ingo ; Stritzker, Bern

Izvornik
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (0168-583X) 238 (2005); 302-305

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
Nanocrystals; quantum dots; X-ray scattering; GISAXS; implantation; CdSe

Sažetak
CdSe quantum dots (QDs) were synthesized by ion-implanting constituent atoms in SiO2, thermally grown on Si-wafer. The influence of implantation and post-implantation treatment parameters was studied by grazing incidence small angle scattering of X-rays (GISAXS). The effect of stoichiometry deviations was analyzed for various Cd:Se ratios in the range of 0.75 to 1.95. The best correlated ensemble of QDs in implanted layer was found for 1.33 and 1.1 Cd:Se ratios, and 30 s post-implant annealing at 700 oC. These findings were related with the amount of well-crystallized CdSe QDs, as found by Raman scattering.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Projekt / tema
0098020
0098022

Ustanove
Institut "Ruđer Bošković", Zagreb

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus


Uključenost u ostale bibliografske baze podataka:


  • The INSPEC Science Abstracts series